Datasheet

MCP3302/04
DS21697F-page 6  2011 Microchip Technology Inc.
1.1 Test Circuits
FIGURE 1-2: Load Circuit for T
R
, T
F
, T
DO
.
FIGURE 1-3: Load circuit for
T
DIS
and
T
EN
.
FIGURE 1-4: Power Supply Sensitivity
Test Circuit (PSRR).
FIGURE 1-5: Full Differential Test
Configuration Example.
FIGURE 1-6: Pseudo Differential Test
Configuration Example.
Test Po int
1.4V
D
OUT
3kΩ
C
L
= 100 pF
MCP330X
*Waveform 1 is for an output with internal
conditions such that the output is high, unless
disabled by the output control.
†Waveform 2 is for an output with internal
conditions such that the output is low, unless
disabled by the output control.
Te st Po i nt
D
OUT
3kΩ
100 pF
T
DIS
Waveform 2
T
DIS
Waveform 1
T
EN
Waveform
V
DD
V
DD
/2
V
SS
V
IH
T
DIS
CS
D
OUT
Waveform 1*
D
OUT
Waveform 2†
90%
10%
Voltage Waveforms for T
DIS
MCP330X
2.63V
-
+
1k
5V ±500 mV
P-P
5V
P-P
1k
20 kΩ
To V
DD
on DUT
1k
1/2 MCP602
V
DD
= 5V
0.1 µF
IN(+)
IN(-)
MCP330X
5V
P-P
V
REF
= 5V
5V
P-P
V
CM
= 2.5V
1µF
0.1 µF
V
REF
V
DD
V
SS
0.1µF
IN(+)
IN(-)
MCP330X
V
DD
= 5V
V
CM
= 2.5V
5V
P-P
V
REF
= 2.5V
1µF
0.1µF
V
REF
V
DD
V
SS