Datasheet

 2001-2011 Microchip Technology Inc. DS21700E-page 5
MCP3301
1.1 Test Circuits
FIGURE 1-2: Load Circuit for t
R
, t
F
,
t
DO.
FIGURE 1-3: Load Circuit for T
DIS
and
T
EN
.
FIGURE 1-4: Power Supply Sensitivity
Test Circuit (PSRR).
FIGURE 1-5: Full Differential Test
Configuration Example.
FIGURE 1-6: Pseudo Differential Test
Configuration Example.
Te st P oi n t
1.4V
D
OUT
3k
C
L
= 100 pF
MCP3301
*Waveform 1 is for an output with internal
conditions such that the output is high, unless
disabled by the output control.
†Waveform 2 is for an output with internal
conditions such that the output is low, unless
disabled by the output control.
V
IH
T
DIS
CS
D
OUT
Waveform 1 *
D
OUT
Waveform 2 †
90%
10%
Voltage Waveforms for t
DIS
Tes t P oi n t
D
OUT
3k 
100 pF
t
DIS
Waveform 2
t
DIS
Waveform 1
t
EN
Waveform
V
DD
V
DD
/2
V
SS
MCP3301
2.63V
-
+
1k
5V ±500 mVp-p
5V
P-P
1k
20 k
To V
DD
on DUT
1k

1/2 MCP602
V
DD
= 5V
0.1 µF
IN(+)
IN(-)
MCP3301
5V
P-P
V
REF
= 5V
5V
P-P
V
CM
= 2.5V
1µF
0.1 µF
V
REF
V
DD
V
SS
0.1 µF
IN(+)
IN(-)
MCP3301
V
DD
=5V
V
CM
=2.5V
5V
P-P
V
REF
=2.5V
1µF
0.1 µF
V
REF
V
DD
V
SS