Datasheet
Table Of Contents
- Features
- Applications
- Description
- Package Types
- Functional Block Diagram
- 1.0 Electrical Characteristics
- PIN FUNCTION TABLE
- electrical characteristics
- 2.0 Typical Performance Characteristics
- FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample Rate.
- FIGURE 2-2: Integral Nonlinearity (INL) vs. Vref.
- FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part).
- FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample Rate (Vdd = 2.7V).
- FIGURE 2-5: Integral Nonlinearity (INL) vs. Vref (Vdd = 2.7V).
- FIGURE 2-6: Integral Nonlinearity (INL) vs. Code (Representative Part, Vdd = 2.7V).
- FIGURE 2-7: Integral Nonlinearity (INL) vs. Temperature.
- FIGURE 2-8: Differential Nonlinearity (DNL) vs. Sample Rate.
- FIGURE 2-9: Differential Nonlinearity (DNL) vs. Vref.
- FIGURE 2-10: Integral Nonlinearity (INL) vs. Temperature (Vdd = 2.7V).
- FIGURE 2-11: Differential Nonlinearity (DNL) vs. Sample Rate (Vdd = 2.7V).
- FIGURE 2-12: Differential Nonlinearity (DNL) vs. Vref (Vdd = 2.7V).
- FIGURE 2-13: Differential Nonlinearity (DNL) vs. Code (Representative Part).
- FIGURE 2-14: Differential Nonlinearity (DNL) vs. Temperature.
- FIGURE 2-15: Gain Error vs. Vref.
- FIGURE 2-16: Differential Nonlinearity (DNL) vs. Code (Representative Part, Vdd = 2.7V).
- FIGURE 2-17: Differential Nonlinearity (DNL) vs. Temperature (Vdd = 2.7V).
- FIGURE 2-18: Offset Error vs. Vref.
- FIGURE 2-19: Gain Error vs. Temperature.
- FIGURE 2-20: Signal to Noise Ratio (SNR) vs. Input Frequency.
- FIGURE 2-21: Total Harmonic Distortion (THD) vs. Input Frequency.
- FIGURE 2-22: Offset Error vs. Temperature.
- FIGURE 2-23: Signal to Noise Ratio and Distortion (SINAD) vs. Input Frequency.
- FIGURE 2-24: Signal to Noise and Distortion (SINAD) vs. Input Signal Level.
- FIGURE 2-25: Effective Number of Bits (ENOB) vs. Vref.
- FIGURE 2-26: Spurious Free Dynamic Range (SFDR) vs. Input Frequency.
- FIGURE 2-27: Frequency Spectrum of 10kHz Input (Representative Part).
- FIGURE 2-28: Effective Number of Bits (ENOB) vs. Input Frequency.
- FIGURE 2-29: Power Supply Rejection (PSR) vs. Ripple Frequency.
- FIGURE 2-30: Frequency Spectrum of 1kHz Input (Representative Part, Vdd = 2.7V).
- FIGURE 2-31: Idd vs. Vdd.
- FIGURE 2-32: Idd vs. Clock Frequency.
- FIGURE 2-33: Idd vs. Temperature.
- FIGURE 2-34: Iref vs. Vdd.
- FIGURE 2-35: Iref vs. Clock Frequency.
- FIGURE 2-36: Iref vs. Temperature.
- FIGURE 2-37: Idds vs. Vdd.
- FIGURE 2-38: Idds vs. Temperature.
- FIGURE 2-39: Analog Input Leakage Current vs. Temperature.
- 3.0 Pin Descriptions
- 4.0 Device Operation
- 5.0 Serial Communications
- 6.0 Applications Information
- 7.0 Packaging Information
- Appendix A: Revision History
- Product Identification System
- Worldwide Sales and Service
© 2007 Microchip Technology Inc. DS21293C-page 5
MCP3001
FIGURE 1-2: Test Circuits.
V
IH
t
DIS
CS
D
OUT
Waveform 1*
D
OUT
Waveform 2†
90%
10%
* Waveform 1 is for an output with internal condi-
tions such that the output is high, unless disabled
by the output control.
† Waveform 2 is for an output with internal condi-
tions such that the output is low, unless disabled
by the output control.
Voltage Waveforms for t
DIS
Test Point
1.4V
D
OUT
Load circuit for t
R
, t
F
, t
DO
3kΩ
C
L
= 30 pF
Test Point
D
OUT
Load circuit for t
DIS
and t
EN
3kΩ
30 pF
t
DIS
Waveform 2
t
DIS
Waveform 1
CS
CLK
D
OUT
t
EN
12
B9
Voltage Waveforms for t
EN
t
EN
Waveform
V
DD
V
DD
/2
V
SS
3
4
D
OUT
t
R
Voltage Waveforms for t
R
, t
F
CLK
D
OUT
t
DO
Voltage Waveforms for t
DO
t
F
V
OH
V
OL