Datasheet

 2008-2012 Microchip Technology Inc. DS22092E-page 3
MCP1415/16
1.0 ELECTRICAL
CHARACTERISTICS
Absolute Maximum Ratings †
V
DD
, Supply Voltage.............................................+20V
V
IN
, Input Voltage..............(V
DD
+ 0.3V) to (GND - 5V)
Package Power Dissipation (T
A
=50°C)
5L SOT23......................................................0.39W
ESD Protection on all Pins......................2.0 kV (HBM)
....................................................................400V (MM)
† Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at those or any other conditions above those
indicated in the operational sections of this specifica-
tion is not intended. Exposure to maximum rating con-
ditions for extended periods may affect device
reliability.
DC CHARACTERISTICS
Electrical Specifications: Unless otherwise noted, T
A
= +25°C, with 4.5V  V
DD
 18V
Parameters Sym Min Typ Max Units Conditions
Input
Logic ‘1’ High Input Voltage V
IH
2.4 1.9 — V
Logic ‘0’ Low Input Voltage V
IL
—1.60.8V
Input Current I
IN
-1 — +1 µA 0V  V
IN
 V
DD
Input Voltage V
IN
-5 — V
DD
+0.3 V
Output
High Output Voltage V
OH
V
DD
- 0.025 — — V DC Test
Low Output Voltage V
OL
— — 0.025 V DC Test
Output Resistance, High R
OH
—67.5 I
OUT
=10mA, V
DD
= 18V
(Note 2)
Output Resistance, Low R
OL
—45.5 I
OUT
=10mA, V
DD
= 18V
(Note 2)
Peak Output Current I
PK
—1.5—AV
DD
=18V (Note 2)
Latch-Up Protection Withstand
Reverse Current
I
REV
0.5 — — A Duty cycle  2%, t  300 µs
(Note 2)
Switching Time (Note 1)
Rise Time t
R
—2025nsFigure 4-1, Figure 4-2
C
L
= 1000 pF (Note 2)
Fall Time t
F
—2025nsFigure 4-1, Figure 4-2
C
L
= 1000 pF (Note 2)
Delay Time t
D1
—4150nsFigure 4-1, Figure 4-2 (Note 2)
Delay Time t
D2
—4855nsFigure 4-1, Figure 4-2 (Note 2)
Power Supply
Supply Voltage V
DD
4.5 — 18 V
Power Supply Current
I
S
— 0.65 1.1 mA V
IN
=3V
I
S
— 0.1 0.15 mA V
IN
=0V
Note 1: Switching times ensured by design.
2: Tested during characterization, not production tested.