Datasheet

 2011-2012 Microchip Technology Inc. DS75018C-page 309
dsPIC33FJ06GS001/101A/102A/202A and dsPIC33FJ09GS302
=
TABLE 25-39: 10-BIT HIGH-SPEED ADC MODULE SPECIFICATIONS
AC CHARACTERISTICS
(2)
Standard Operating Conditions: 3.0V and 3.6V
(unless otherwise stated)
Operating temperature -40°C  T
A  +85°C for Industrial
-40°C  T
A  +125°C for Extended
Param. Symbol Characteristic Min. Typ. Max. Units Conditions
Device Supply
AD01 AV
DD Module VDD Supply — — — — AVDD is internally connected
to V
DD on 18-pin and 28-pin
devices. See parameters
(DC10) in Table 25-4.
AD02 AV
SS Module VSS Supply — — — — AVSS is internally connected to
V
SS on 18-pin and 28-pin
devices
Analog Input
AD10 V
INH-VINL Full-Scale Input Span VSS —VDD V
AD11 V
IN Absolute Input Voltage AVSS —AVDD V
AD12 I
AD Operating Current — 8 — mA
AD13 — Leakage Current — ±0.6 — AV
INL = AVSS = 0V,
AV
DD = 3.3V,
Source Impedance = 100
AD17 R
IN Recommended Impedance
of Analog Voltage Source
——100
DC Accuracy @ 1.5 Msps for 18 and 28-Pin Devices
AD20a Nr Resolution 10 data bits
AD21a INL Integral Nonlinearity -0.5 -0.3/+0.5 +1.2 LSb See Note 3
AD22a DNL Differential Nonlinearity -0.9 ±0.6 +0.9 LSb See Note 3
AD23a G
ERR Gain Error — 10 20 LSb See Note 3
AD24a E
OFF Offset Error — 10 20 LSb See Note 3
AD25a — Monotonicity
(1)
— — — — Guaranteed
DC Accuracy @ 2.0 Msps for 18 and 28-Pin Devices
AD20b Nr Resolution 10 data bits
AD21b INL Integral Nonlinearity -1 ±1.5 +2.8 LSb
AD22b DNL Differential Nonlinearity -1.5 ±2 +2.8 LSb
AD23b G
ERR Gain Error — 10 20 LSb
AD24b E
OFF Offset Error — 10 20 LSb
AD25b — Monotonicity
(1)
— — — — Guaranteed
DC Accuracy @ 2.0 Msps for 20 and 36-Pin Devices
AD20c Nr Resolution 10 data bits
AD21c INL Integral Nonlinearity > -2 ±0.5 < 2 LSb See Note 3
AD22c DNL Differential Nonlinearity > -1 ±0.5 < 1 LSb See Note 3
AD23c G
ERR Gain Error — 10 20 LSb See Note 3
AD24c E
OFF Offset Error — 10 20 LSb See Note 3
AD25c — Monotonicity
(1)
— — — — Guaranteed
Note 1: The Analog-to-Digital conversion result never decreases with an increase in input voltage and has no missing codes.
2: Overall functional device operation at V
BORMIN < VDD < VDDMIN is tested but not characterized. All device analog
modules, such as the ADC, etc., will function, but with degraded performance below V
DDMIN. Refer to
Parameter BO10 in Table 25-11 for BOR values.
3: These parameters are characterized by similarity, but are not tested in manufacturing.