Datasheet

Table Of Contents
dsPIC30F6011A/6012A/6013A/6014A
DS70143E-page 182 © 2011 Microchip Technology Inc.
TABLE 23-11: ELECTRICAL CHARACTERISTICS: BOR
DC CHARACTERISTICS
Standard Operating Conditions: 2.5V to 5.5V
(unless otherwise stated)
Operating temperature -40°C TA +85°C for Industrial
-40°C T
A +125°C for Extended
Param
No.
Symbol Characteristic Min Typ
(1)
Max Units Conditions
BO10 V
BOR BOR Voltage
(2)
on
VDD transition high to
low
BORV = 11
(3)
V Not in operating
range
BORV = 10 2.6 2.71 V
BORV = 01 4.1 4.4 V
BORV = 00 4.58 4.73 V
BO15 V
BHYS —5—mV
Note 1: Data in “Typ” column is at 5V, 25°C unless otherwise stated. Parameters are for design guidance only and
are not tested.
2: These parameters are characterized but not tested in manufacturing.
3: 11’ values not in usable operating range.
TABLE 23-12: DC CHARACTERISTICS: PROGRAM AND EEPROM
DC CHARACTERISTICS
Standard Operating Conditions: 2.5V to 5.5V
(unless otherwise stated)
Operating temperature -40°C TA +85°C for Industrial
-40°C TA +125°C for Extended
Param
No.
Symbol Characteristic Min Typ
(1)
Max Units Conditions
Data EEPROM Memory
(2)
D120 ED Byte Endurance 100K 1M E/W -40° C TA +85°C
D121 VDRW VDD for Read/Write VMIN 5.5 V Using EECON to read/write
VMIN = Minimum operating
voltage
D122 TDEW Erase/Write Cycle Time 0.8 2 2.6 ms RTSP
D123 T
RETD Characteristic Retention 40 100 Year Provided no other specifications
are violated
D124 IDEW IDD During Programming 10 30 mA Row Erase
Program FLASH Memory
(2)
D130 EP Cell Endurance 10K 100K E/W -40° C TA +85°C
D131 VPR VDD for Read VMIN —5.5VVMIN = Minimum operating
voltage
D132 V
EB VDD for Bulk Erase 4.5 5.5 V
D133 VPEW VDD for Erase/Write 3.0 5.5 V
D134 T
PEW Erase/Write Cycle Time 0.8 2 2.6 ms RTSP
D135 T
RETD Characteristic Retention 40 100 Year Provided no other specifications
are violated
D137 I
PEW IDD During Programming 10 30 mA Row Erase
D138 I
EB IDD During Programming 10 30 mA Bulk Erase
Note 1: Data in “Typ” column is at 5V, 25°C unless otherwise stated.
2: These parameters are characterized but not tested in manufacturing.