Datasheet

LCD MODULE TSB1G7000-E Version :1.0 July 29, 2008
TRULY SEMICONDUCTORS LTD.
P.15
TRULY
®
OUTGOING QUALITY STANDARD
PAGE 6 OF 7
TITLE:FUNCTIONAL TEST & INSPECTION CRITERIA
Mono COG Product
5. Cosmetic Defect
Item
No
Items to be
inspected
Inspection Standard
Classification
of defects
(ii) Chips between top/bottom glass. Acceptable for chips
not extend to seal part.
(ii) chips inside viewing area:spot chips located inside
viewing area should be treated as spot defect.
(iii) Crack on corner
X Y Z
≤5.0 ≤S/3
t
Notes: 1. Not to reach B zone
2. Target mark must be remained.
3. At least 2/3 of the electrode area should be
remained .
(iv) Usual surface cracks
X Y Z
Acceptable
≤0.3
T/2
≤A/6 ≤1.5
T/2
≤A/8 ≤1.0
T
5.6 Glass
defect
Notes: 1. Not to reach B zone
2. The total number of the glass defect should not
be more than five.
Minor