Datasheet
LCD MODULE TSB1G7000-E Version :1.0 July 29, 2008
TRULY SEMICONDUCTORS LTD.
P.14
TRULY
®
OUTGOING QUALITY STANDARD
PAGE 5 OF 7
TITLE:FUNCTIONAL TEST & INSPECTION CRITERIA
Mono COG Product
5. Cosmetic Defect
Item
No
Items to be
inspected
Inspection Standard
Classification
of defects
5.5 Segment
deformity
5.5.2 PIN Hole
Acceptable if the following cases are fulfill:
0.1≤Φ≤0.25 mm acceptable MAX 5/PCS where Φ
=1/2(X+Y)
Minor
5.6.1 glass protrusion
(i) Maximum protrusion of outline should not exceed the
maximum outline dimension in product drawing.
5.6.2 Cracks on glass is not acceptable.
Major
5.6 Glass
defect
5.6.3 Chipped glass definition:
r=contact pad width
s=contact pab length
t=glass thickness
x=width of chipped area
y=length of chipped area
z=depth of chipped area
a=dimension of glass length
Fig. 2 glass chips on LCD.
(i) Chips on contact pab(unit:mm)
X Y Z
acceptable
≤0.3 ≤t/2
≤a/8 ≤0.8 ≤t
≤a/6 ≤0.5 ≤t
Minor