Datasheet

 2012 Microchip Technology Inc. DS30575A-page 517
PIC18F97J94 FAMILY
26.4.2 CAPACITANCE CALIBRATION
There is a small amount of capacitance from the inter-
nal A/D Converter sample capacitor, as well as stray
capacitance from the circuit board traces and pads that
affect the precision of capacitance measurements. A
measurement of the stray capacitance can be taken by
making sure the desired capacitance to be measured
has been removed.
After removing the capacitance to be measured:
1. Initialize the A/D Converter and the CTMU.
2. Set EDG1STAT (= 1).
3. Wait for a fixed delay of time, t.
4. Clear EDG1STAT.
5. Perform an A/D conversion.
6. Calculate the stray and A/D sample capacitances:
Where:
• I is known from the current source measurement
step
• t is a fixed delay
• V is measured by performing an A/D conversion
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
STRAY + CAD is
approximately known; C
AD is approximately 4 pF.
An iterative process may be required to adjust the time,
t, that the circuit is charged to obtain a reasonable volt-
age reading from the A/D Converter. The value of t may
be determined by setting C
OFFSET to a theoretical value
and solving for t. For example, if C
STRAY is theoretically
calculated to be 11 pF, and V is expected to be 70% of
V
DD or 2.31V, t would be:
or 63 s.
See Example 26-3 for a typical routine for CTMU
capacitance calibration.
COFFSET = CSTRAY + CAD = (I • t)/V
(4 pF + 11 pF) • 2.31V/0.55 mA