Datasheet

703
32133D–11/2011
UC3D
31.6.2.4 INTEST
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
inputs.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
inputs.
10. Return to Run-Test/Idle.
31.6.2.5 CLAMP
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
Table 31-44. INTEST Details
Instructions Details
IR input value 00100 (0x04)
IR output value p0001
DR Size Depending on boundary-scan chain, see BSDL-file.
DR input value Depending on boundary-scan chain, see BSDL-file.
DR output value Depending on boundary-scan chain, see BSDL-file.