Datasheet

ManualsBrandsMICROCHIP TECHNOLOGY ManualsMicrocontrollers, Microprocessors & QuartzesEmbedded microcontroller QFN 20 (4x4) 8-Bit 20 MHz I/O number 12

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Table Of Contents

Features
1. Pin Configurations
- 1.1 Pin Descriptions
2. Overview
3. About
- 3.1 Resources
- 3.2 Code Examples
- 3.3 Data Retention
- 3.4 Disclaimer
4. CPU Core
- 4.1 Architectural Overview
- 4.2 ALU – Arithmetic Logic Unit
- 4.3 Status Register
  - 4.3.1 SREG – AVR Status Register
- 4.4 General Purpose Register File
  - 4.4.1 The X-register, Y-register, and Z-register
- 4.5 Stack Pointer
  - 4.5.1 SPH and SPL — Stack Pointer Register
- 4.6 Instruction Execution Timing
- 4.7 Reset and Interrupt Handling
  - 4.7.1 Interrupt Response Time
5. Memories
- 5.1 In-System Re-programmable Flash Program Memory
- 5.2 SRAM Data Memory
  - 5.2.1 Data Memory Access Times
- 5.3 EEPROM Data Memory
- 5.4 I/O Memory
  - 5.4.1 General Purpose I/O Registers
- 5.5 Register Description
6. Clock System
- 6.1 Clock Subsystems
- 6.2 Clock Sources
- 6.3 System Clock Prescaler
  - 6.3.1 Switching Time
- 6.4 Clock Output Buffer
- 6.5 Register Description
  - 6.5.1 OSCCAL – Oscillator Calibration Register
  - 6.5.2 CLKPR – Clock Prescale Register
7. Power Management and Sleep Modes
- 7.1 Sleep Modes
- 7.2 Software BOD Disable
  - 7.2.1 Limitations
- 7.3 Power Reduction Register
- 7.4 Minimizing Power Consumption
- 7.5 Register Description
  - 7.5.1 MCUCR – MCU Control Register
  - 7.5.2 PRR – Power Reduction Register
8. System Control and Reset
- 8.1 Resetting the AVR
- 8.2 Reset Sources
- 8.3 Internal Voltage Reference
  - 8.3.1 Voltage Reference Enable Signals and Start-up Time
- 8.4 Watchdog Timer
  - 8.4.1 Timed Sequences for Changing the Configuration of the Watchdog Timer
    - 8.4.1.1 Safety Level 1
    - 8.4.1.2 Safety Level 2
  - 8.4.2 Code Example
- 8.5 Register Description
  - 8.5.1 MCUSR – MCU Status Register
  - 8.5.2 WDTCSR – Watchdog Timer Control and Status Register
9. Interrupts
- 9.1 Interrupt Vectors
- 9.2 External Interrupts
  - 9.2.1 Low Level Interrupt
  - 9.2.2 Pin Change Interrupt Timing
- 9.3 Register Description
10. I/O Ports
- 10.1 Ports as General Digital I/O
- 10.2 Alternate Port Functions
  - 10.2.1 Alternate Functions of Port A
  - 10.2.2 Alternate Functions of Port B
- 10.3 Register Description
11. 8-bit Timer/Counter0 with PWM
- 11.1 Features
- 11.2 Overview
  - 11.2.1 Registers
  - 11.2.2 Definitions
- 11.3 Clock Sources
- 11.4 Counter Unit
- 11.5 Output Compare Unit
- 11.6 Compare Match Output Unit
  - 11.6.1 Compare Output Mode and Waveform Generation
- 11.7 Modes of Operation
- 11.8 Timer/Counter Timing Diagrams
- 11.9 Register Description
12. 16-bit Timer/Counter1
- 12.1 Features
- 12.2 Overview
- 12.3 Timer/Counter Clock Sources
- 12.4 Counter Unit
- 12.5 Input Capture Unit
- 12.6 Output Compare Units
- 12.7 Compare Match Output Unit
  - 12.7.1 Compare Output Mode and Waveform Generation
- 12.8 Modes of Operation
- 12.9 Timer/Counter Timing Diagrams
- 12.10 Accessing 16-bit Registers
  - 12.10.1 Reusing the Temporary High Byte Register
- 12.11 Register Description
13. Timer/Counter Prescaler
- 13.1 Prescaler Reset
- 13.2 External Clock Source
- 13.3 Register Description
  - 13.3.1 GTCCR – General Timer/Counter Control Register
14. USI – Universal Serial Interface
- 14.1 Features
- 14.2 Overview
- 14.3 Functional Descriptions
- 14.4 Alternative USI Usage
- 14.5 Register Descriptions
15. Analog Comparator
- 15.1 Analog Comparator Multiplexed Input
- 15.2 Register Description
16. Analog to Digital Converter
- 16.1 Features
- 16.2 Overview
- 16.3 Operation
- 16.4 Starting a Conversion
- 16.5 Prescaling and Conversion Timing
- 16.6 Changing Channel or Reference Selection
  - 16.6.1 ADC Input Channels
  - 16.6.2 ADC Voltage Reference
- 16.7 ADC Noise Canceler
- 16.8 Analog Input Circuitry
- 16.9 Noise Canceling Techniques
- 16.10 ADC Accuracy Definitions
- 16.11 ADC Conversion Result
- 16.12 Temperature Measurement
- 16.13 Register Description
17. debugWIRE On-chip Debug System
- 17.1 Features
- 17.2 Overview
- 17.3 Physical Interface
- 17.4 Software Break Points
- 17.5 Limitations of debugWIRE
- 17.6 Register Description
  - 17.6.1 DWDR – debugWire Data Register
18. Self-Programming the Flash
- 18.1 Performing Page Erase by SPM
- 18.2 Filling the Temporary Buffer (Page Loading)
- 18.3 Performing a Page Write
- 18.4 Addressing the Flash During Self-Programming
- 18.5 EEPROM Write Prevents Writing to SPMCSR
- 18.6 Reading Lock, Fuse and Signature Data from Software
- 18.7 Preventing Flash Corruption
- 18.8 Programming Time for Flash when Using SPM
- 18.9 Register Description
  - 18.9.1 SPMCSR – Store Program Memory Control and Status Register
19. Memory Programming
- 19.1 Program And Data Memory Lock Bits
- 19.2 Fuse Bytes
  - 19.2.1 Latching of Fuses
- 19.3 Device Signature Imprint Table
  - 19.3.1 Signature Bytes
  - 19.3.2 Calibration Byte
- 19.4 Page Size
- 19.5 Serial Programming
  - 19.5.1 Serial Programming Algorithm
  - 19.5.2 Serial Programming Instruction set
- 19.6 High-voltage Serial Programming
- 19.7 High-Voltage Serial Programming Algorithm
20. Electrical Characteristics
- 20.1 Absolute Maximum Ratings*
- 20.2 DC Characteristics
- 20.3 Speed
- 20.4 Clock Characteristics
  - 20.4.1 Accuracy of Calibrated Internal RC Oscillator
  - 20.4.2 External Clock Drive
- 20.5 System and Reset Characteristics
- 20.6 Analog Comparator Characteristics
- 20.7 ADC Characteristics
- 20.8 Serial Programming Characteristics
- 20.9 High-Voltage Serial Programming Characteristics
21. Typical Characteristics
- 21.1 Supply Current of I/O Modules
  - 21.1.1 Example
- 21.2 Active Supply Current
- 21.3 Idle Supply Current
- 21.4 Power-down Supply Current
- 21.5 Standby Supply Current
- 21.6 Pin Pull-up
- 21.7 Pin Driver Strength
- 21.8 Pin Threshold and Hysteresis
- 21.9 BOD Threshold and Analog Comparator Offset
- 21.10 Internal Oscillator Speed
- 21.11 Current Consumption of Peripheral Units
- 21.12 Current Consumption in Reset and Reset Pulsewidth
22. Register Summary
23. Instruction Set Summary
24. Ordering Information
- 24.1 ATtiny24
- 24.2 ATtiny44
- 24.3 ATtiny84
25. Packaging Information
- 25.1 20M1
- 25.2 14P3
- 25.3 14S1
26. Errata
- 26.1 ATtiny24
- 26.2 ATtiny44
  - 26.2.1 Rev. B – D
  - 26.2.2 Rev. A
- 26.3 ATtiny84
  - 26.3.1 Rev. A – B
27. Datasheet Revision History
- 27.1 Rev K. - 10/10
- 27.2 Rev J. - 08/10
- 27.3 Rev I. - 06/10
- 27.4 Rev H. 10/09
- 27.5 Rev G. 01/08
- 27.6 Rev F. 02/07
- 27.7 Rev E. 09/06
- 27.8 Rev D. 08/06
- 27.9 Rev C. 07/06
- 27.10 Rev B. 05/06
- 27.11 Rev A. 12/05
Table of Contents

140

8006K–AVR–10/10

ATtiny24/44/84

Figure 16-8. Analog Input Circuitry

Note: The capacitor in the figure depicts the total capacitance, including the sample/hold capacitor and

any stray or parasitic capacitance inside the device. The value given is worst case.

16.9 Noise Canceling Techniques

Digital circuitry inside and outside the device generates EMI which might affect the accuracy of

analog measurements. When conversion accuracy is critical, the noise level can be reduced by

applying the following techniques:

• Keep analog signal paths as short as possible.

• Make sure analog tracks run over the analog ground plane.

• Keep analog tracks well away from high-speed switching digital tracks.

• If any port pin is used as a digital output, it mustn’t switch while a conversion is in progress.

• Place bypass capacitors as close to V

and GND pins as possible.

Where high ADC accuracy is required it is recommended to use ADC Noise Reduction Mode, as

described in Section 16.7 on page 139. This is especially the case when system clock frequency

is above 1 MHz, or when the ADC is used for reading the internal temperature sensor, as

described in Section 16.12 on page 144. A good system design with properly placed, external

bypass capacitors does reduce the need for using ADC Noise Reduction Mode

16.10 ADC Accuracy Definitions

An n-bit single-ended ADC converts a voltage linearly between GND and V

REF

in 2

steps

(LSBs). The lowest code is read as 0, and the highest code is read as 2

-1.

Several parameters describe the deviation from the ideal behavior, as follows:

ADCn

1..100 kohm

S/H

= 14 pF