Datasheet

940
Atmel | SMART SAM D21 [DATASHEET]
Atmel-42181C–SAM-D21_Datasheet–07/2014
Table 36-19. BOD33 Characteristics
Note: 1. These values are based on simulation. These values are not covered by test limits in production or
characterization.
36.9.4 Analog-to-Digital (ADC) characteristics
Notes: 1. These values are based on characterization. These values are not covered by test limits in production.
Symbol Parameter Conditions Min. Typ. Max. Units
I
Step size, between
adjacent values in
BOD33.LEVEL
I
- 34 - mV
V
HYST
Hysteresis
I
35 - 170 mV
t
DET
Detection time
Time with V
DDANA
< V
TH
necessary to generate a
reset signal
- 0.9
(1)
- µs
I
BOD33
Current
consumption
Continuous mode 2.9 33 52.2
µA
Sampling mode - 23 75.5
t
STARTUP
Startup time
I
- 2.2
(1)
- µs
Table 36-20. Operating Conditions
Symbol Parameter Conditions Min. Typ. Max. Units
RES Resolution
I
8 - 12 bits
f
CLK_ADC
ADC Clock frequency
I
30 - 2100 kHz
Sample rate
(1)
Single shot 5 - 300 ksps
Free running 5 - 350 ksps
Sampling time
(1)
0.5 - - cycles
Conversion time
(1)
1x Gain 6 - - cycles
V
REF
Voltage reference range 1.0 - V
DDANA
-0.6 V
V
REFINT1V
Internal 1V reference
(2)
- 1.0 - V
V
REFINTVCC0
Internal ratiometric
reference 0
(2)
- V
DDANA
/1.48 - V
V
REFINTVCC1
Internal ratiometric
reference 1
(2)
V
DDANA
>2.0V - V
DDANA
/2 - V
Conversion range
(1)
Differential mode -V
REF
/GAIN - +V
REF
/GAIN V
Single-ended mode 0.0 - +V
REF
/GAIN V
C
SAMPLE
Sampling capacitance
(2)
- 3.5 - pF
R
SAMPLE
Input channel source
resistance
(2)
- - 3.5 kΩ
I
DD
DC supply current
(1)
f
CLK_ADC
= 2.1MHz I
(3)
- 1.25 1.79 mA