Datasheet

474
Atmel | SMART SAM D20 [DATASHEET]
Atmel-42129K–SAM-D20_datasheet–06/2014
28. ADC – Analog-to-Digital Converter
28.1 Overview
The Analog-to-Digital Converter (ADC) converts analog signals to digital values. The ADC has 12-bit resolution, and is
capable of converting up to 350ksps. The input selection is flexible, and both differential and single-ended measurements
can be performed. An optional gain stage is available to increase the dynamic range. In addition, several internal signal
inputs are available. The ADC can provide both signed and unsigned results.
ADC measurements can be started by either application software or an incoming event from another peripheral in the
device. ADC measurements can be started with predictable timing, and without software intervention.
Both internal and external reference voltages can be used.
An integrated temperature sensor is available for use with the ADC. The bandgap voltage as well as the scaled I/O and
core voltages can also be measured by the ADC.
The ADC has a compare function for accurate monitoring of user-defined thresholds, with minimum software intervention
required.
The ADC may be configured for 8-, 10- or 12-bit results, reducing the conversion time. ADC conversion results are
provided left- or right-adjusted, which eases calculation when the result is represented as a signed value.
28.2 Features
z 8-, 10- or 12-bit resolution
z Up to 350,000 samples per second (350ksps)
z Differential and single-ended inputs
z Up to 32 analog inputs
z 25 positive and 10 negative, including internal and external
z Five internal inputs
z Bandgap
z Temperature sensor
z DAC
z Scaled core supply
z Scaled I/O supply
z 1/2x to 16x gain
z Single, continuous and pin-scan conversion options
z Windowing monitor with selectable channel
z Conversion range:
z V
ref
[1v to V
DDANA
- 0.6V]
z ADCx * GAIN [0V to -V
ref
]
z Built-in internal reference and external reference options
z Four bits for reference selection