Datasheet

259
SAM4S Series [DATASHEET]
11100F–ATARM–29-Jan-14
13. Debug and Test Features
13.1 Description
The SAM4 series microcontrollers feature a number of complementary debug and test capabilities. The Serial
Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port (SW-DP) and JTAG Debug (JTAG-DP) port
is used for standard debugging functions, such as downloading code and single-stepping through programs. It also
embeds a serial wire trace.
13.2 Embedded Characteristics
 Debug access to all memory and registers in the system, including Cortex-M4 register bank when the core is
running, halted, or held in reset.
 Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
 Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
 Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and system profiling
 Instrumentation Trace Macrocell (ITM) for support of printf style debugging
 IEEE1149.1 JTAG Boundary-can on All Digital Pins
Figure 13-1. Debug and Test Block Diagram
TST
TMS
TCK/SWCLK
TDI
JTAGSEL
TDO/TRACESWO
Boundary
TAP
SWJ-DP
Reset
and
Test
POR