Datasheet

75
42023E–SAM–07/2013
ATSAM4L8/L4/L2
8.7.14.4 CLAMP
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
9. Return to Run-Test/Idle.
Table 8-8. CLAMP Details
Instructions Details
IR input value 0101 (0x5)
IR output value p00s
DR Size 1
DR input value x
DR output value x