Datasheet

74
42023E–SAM–07/2013
ATSAM4L8/L4/L2
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan
chain.
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
8.7.14.3 INTEST
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
inputs.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic inputs.
10. Return to Run-Test/Idle.
Table 8-6. SAMPLE_PRELOAD Details
Instructions Details
IR input value 0001 (0x1)
IR output value p00s
DR Size Depending on boundary-scan chain, see BSDL-file.
DR input value Depending on boundary-scan chain, see BSDL-file.
DR output value Depending on boundary-scan chain, see BSDL-file.
Table 8-7. INTEST Details
Instructions Details
IR input value 0100 (0x4)
IR output value p001
DR Size Depending on boundary-scan chain, see BSDL-file.
DR input value Depending on boundary-scan chain, see BSDL-file.
DR output value Depending on boundary-scan chain, see BSDL-file.