Datasheet

71
42023E–SAM–07/2013
ATSAM4L8/L4/L2
8.7.12 JTAG Instructions Summary
The implemented JTAG instructions are shown in the table below.
Table 8-2. Implemented JTAG instructions list
IR instruction
value
Instruction Description
availability
when
protected
Component
b0000 EXTEST
Select boundary-scan chain as data register for
testing circuitry external to
the device.
yes
BSCAN-TAP
b0001 SAMPLE_PRELOAD
Take a snapshot of external pin values without
affecting system operation.
yes
b0100 INTEST
Select boundary-scan chain for internal testing of the
device.
yes
b0101 CLAMP
Bypass device through Bypass register, while driving
outputs from boundary-scan register.
yes
b1000 ABORT ARM JTAG-DP Instruction yes
SWJ-DP
(in JTAG mode)
b1010 DPACC ARM JTAG-DP Instruction yes
b1011 APACC ARM JTAG-DP Instruction yes
b1100 - Reserved yes
b1101 - Reserved yes
b1110 IDCODE ARM JTAG-DP Instruction yes
b1111 BYPASS Bypass this device through the bypass register. yes