Datasheet

SAM4E [DATASHEET]
Atmel-11157D-ATARM-SAM4E16-SAM4E8-Datasheet_12-Jun-14
418
22.3 Parallel Fast Flash Programming
22.3.1 Device Configuration
In Fast Flash Programming Mode, the device is in a specific test mode. Only a certain set of pins is significant. The
rest of the PIOs are used as inputs with a pull-up. The crystal oscillator is in bypass mode. Other pins must be left
unconnected.
Figure 22-1. SAM4ExE Parallel Programming Interface
NCMD
PGMNCMD
RDY
PGMRDY
NOE
PGMNOE
NVALID
PGMNVALID
MODE[3:0]
PGMM[3:0]
DATA[15:0]
PGMD[15:0]
XIN
TST
VDDIO
PGMEN0
PGMEN1
0 - 50MHz
VDDIO
VDDCORE
VDDIO
VDDPLL
GND
VDDIO
Table 22-1. Signal Description List
Signal Name Function Type
Active
Level Comments
Power
VDDIO I/O Lines Power Supply Power
VDDCORE Core Power Supply Power
VDDPLL PLL Power Supply Power
GND Ground Ground
Clocks
XIN
Main Clock Input.
This input can be tied to GND. In this
case, the device is clocked by the internal
RC oscillator.
Input 32 kHz to 50 MHz
Test
TST Test Mode Select Input High Must be connected to VDDIO
PGMEN0 Test Mode Select Input High Must be connected to VDDIO
PGMEN1 Test Mode Select Input High Must be connected to VDDIO
PIO
PGMNCMD Valid command available Input Low Pulled-up input at reset