Datasheet

1435
SAM4E [DATASHEET]
Atmel-11157D-ATARM-SAM4E16-SAM4E8-Datasheet_12-Jun-14
47.6 USB Transceiver Characteristics
47.6.1 Typical Connection
For typical connection please refer to the USB Device Section.
47.6.2 Electrical Characteristics
Table 47-25. Electrical Parameters
Symbol Parameter Conditions Min Typ Max Unit
Input Levels
V
IL
Low Level — — — 0.8 V
V
IH
High Level — 2.0 — — V
V
DI
Differential Input Sensitivity |(D+) - (D-)| 0.2 — — V
V
CM
Differential Input Common Mode
Range
— 0.8 — 2.5 V
C
IN
Transceiver capacitance Capacitance to ground on each line — — 9.18 pF
I
lkg
Hi-Z State Data Line Leakage 0V < V
IN
< 3.3V -10 — +10 µA
R
EXT
Recommended External USB
Series Resistor
In series with each USB pin with ±5% — 27 — Ω
Output Levels
V
OL
Low Level Output
Measured with R
L
of 1.425 kΩ tied to
3.6V
0.0 — 0.3 V
V
OH
High Level Output
Measured with R
L
of 14.25 kΩ tied to
GND
2.8 — 3.6 V
V
CRS
Output Signal Crossover Voltage
Measure conditions described in
Figure 47-13 “USB Data Signal Rise
and Fall Times”
1.3 — 2.0 V
Consumption
I
VDDIO
Current Consumption
Transceiver enabled in input mode
DDP = 1 and DDM = 0
— 105 200 µA
I
VDDCORE
Current Consumption — 80 150 µA
Pull-up Resistor
R
PUI
Bus Pull-up Resistance on
Upstream Port (idle bus)
— 0.900 — 1.575 kΩ
R
PUA
Bus Pull-up Resistance on
Upstream Port (upstream port
receiving)
— 1.425 — 3.090 kΩ