Datasheet

201
11011B–ATARM–21-Feb-12
SAM3N
11. Debug and Test Features
11.1 Description
The SAM3 Series Microcontrollers feature a number of complementary debug and test
capabilities. The Serial Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port
(SW-DP) and JTAG Debug(JTAG-DP) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. It also embeds a serial wire trace.
11.2 Embedded Characteristics
• Debug access to all memory and registers in the system, including Cortex-M3 register bank
when the core is running, halted, or held in reset.
• Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
• Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
• Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and
system profiling
• Instrumentation Trace Macrocell (ITM) for support of printf style debugging
• IEEE1149.1 JTAG Boundary-can on All Digital Pins
Figure 11-1. Debug and Test Block Diagram
TST
TMS
TCK/SWCLK
TDI
JTAGSEL
TDO/TRACESWO
Boundary
TA P
SWJ-DP
Reset
and
Test
POR