Datasheet

6Atmel ATmega16M1/32M1/32C1/64M1/64C1 Automotive [DATASHEET]
7781E–AVR–03/12
2. Grade 0 Qualification
The ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has been developed and manufactured
according to the most stringent quality assurance requirements of ISO-TS-16949 and verified during product qualification as per
AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field usage however may result in
less significant stress test acceleration. In order to prevent the risk that
ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 lifetime would not satisfy the application end-of-life
reliability requirements, Atmel
®
has extended the testing, whenever applicable (High Temperature Operating Life Test, High
Temperature Storage Life, Data Retention, Thermal Cycles), far beyond the AEC-Q100 requirements. Thereby, Atmel verified
the ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has a long safe lifetime period after the grade 0
qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mechanism that is considered. Therefore
any temperature mission profile which could exceed the AEC-Q100 equivalence domain shall be submitted to Atmel for a
thorough reliability analysis
Figure 2-1. AEC-Q100 Lifetime Equivalence
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020406080100120140160
Temperature (°C)
Hours
HTOL 0,59eV HTSL 0,45eV