Datasheet

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225
ATmega32A [DATASHEET]
Atmel-8155D-AVR-ATmega32A-Datasheet_02/2014
25.5.6 Scanning the ADC
Figure 24-10 shows a block diagram of the ADC with all relevant control and observe signals. The Boundary-scan cell from
Figure 24-9 is attached to each of these signals. The ADC need not be used for pure connectivity testing, since all analog
inputs are shared with a digital port pin as well.
Figure 25-10. Analog to Digital Converter
The signals are described briefly in Table 24-5.
Table 25-4. Boundary-scan Signals for the Analog Comparator
Signal
Name
Direction as Seen from
the Comparator Description
Recommended Input
when Not in Use
Output Values when
Recommended Inputs are Used
AC_IDLE Input Turns off Analog
comparator when true
1 Depends upon µC code being
executed
ACO Output Analog Comparator
Output
Will become input to µC
code being executed
0
ACME Input Uses output signal from
ADC mux when true
0 Depends upon µC code being
executed
ACBG Input Bandgap Reference
enable
0 Depends upon µC code being
executed
10-bit DAC +
-
AREF
PRECH
DACOUT
COMP
MUXEN_7
ADC_7
MUXEN_6
ADC_6
MUXEN_5
ADC_5
MUXEN_4
ADC_4
MUXEN_3
ADC_3
MUXEN_2
ADC_2
MUXEN_1
ADC_1
MUXEN_0
ADC_0
NEGSEL_2
ADC_2
NEGSEL_1
ADC_1
NEGSEL_0
ADC_0
EXTCH
+
-
+
-
10x 20x
G10 G20
ST
ACLK
AMPEN
2.56V
ref
IREFEN
AREF
VCCREN
DAC_9..0
ADCEN
HOLD
PRECH
GNDEN
PASSEN
ACTEN
COMP
SCTEST
ADCBGEN
To Comparator
1.22V
ref
AREF