Datasheet

165
ATmega323(L)
1457E–11/01
Figure 91. Observe-only Cell
Internal signals ATmega323 contains a lot of scan chains for internal signals. The description of these
signals are not public. However, the user must apply safe values to these cells before
applying the Update-DR state of the TAP controller.
Note: Incorrect setting of the scan cells for internal signals may cause signal contention and
can damage the part. Make sure the safe values are used.
0
1
DQ
From
previous
cell
ClockDR
ShiftDR
To
next
cell
From system pin
To system logic
FF1
Table 57. Boundary-scan signals for the ADC
Signal Name Type of scan cell Recommended input when not in use
SIG_PRIVATE0 General Scan Cell 1
SIG_PRIVATE1 General Scan Cell 0
SIG_PRIVATE2 General Scan Cell 0
SIG_PRIVATE3 General Scan Cell 0
SIG_PRIVATE4 General Scan Cell 0
SIG_PRIVATE5 General Scan Cell 0
SIG_PRIVATE6 General Scan Cell 0
SIG_PRIVATE7 General Scan Cell 0
SIG_PRIVATE8 General Scan Cell 0
SIG_PRIVATE9 General Scan Cell 0
SIG_PRIVATE10 General Scan Cell 0
SIG_PRIVATE11 General Scan Cell 1
SIG_PRIVATE12 General Scan Cell 0
SIG_PRIVATE13 General Scan Cell 0
SIG_PRIVATE14 General Scan Cell 0
SIG_PRIVATE15 General Scan Cell 0
SIG_PRIVATE16 General Scan Cell 0
SIG_PRIVATE17 General Scan Cell 0
SIG_PRIVATE18 General Scan Cell 0