Datasheet

202
ATmega162/V
2513G–AVR–03/05
Bibliography For more information about general Boundary-scan, the following literature can be
consulted:
• IEEE: IEEE Std. 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan
Architecture, IEEE, 1993
• Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-
Wesley, 1992