Datasheet

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SAM9X35 [DATASHEET]
11055E–ATARM–10-Mar-2014
10.4.2 Test Environment
Figure 10-3 shows a test environment example. Test vectors are sent and interpreted by the tester. In this example, the
“board in test” is designed using a number of JTAG-compliant devices. These devices can be connected to form a single
scan chain.
Figure 10-3. Application Test Environment Example
JTAG
Interface
ICE/JTAG
Connector
SAM9-based Application Board In Test
SAM9
Test Adaptor
Chip 2Chip n
Chip 1
Tester