Datasheet

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SAM9G45 [Summary]
6438IS–ATARM–12-Feb-13
6.6 Debug and Test Features
z ARM926 Real-time In-circuit Emulator
z Two real-time Watchpoint Units
z Two Independent Registers: Debug Control Register and Debug Status Register
z Test Access Port Accessible through JTAG Protocol
z Debug Communications Channel
z Debug Unit
z Two-pin UART
z Debug Communication Channel Interrupt Handling
z Chip ID Register
z IEEE1149.1 JTAG Boundary-scan on All Digital Pins.