Datasheet

316
7593L–AVR–09/12
AT90USB64/128
26.7.2 Analog noise canceling techniques
Digital circuitry inside and outside the device generates EMI which might affect the accuracy of
analog measurements. If conversion accuracy is critical, the noise level can be reduced by
applying the following techniques:
a. Keep analog signal paths as short as possible. Make sure analog tracks run over
the analog ground plane, and keep them well away from high-speed switching digi-
tal tracks.
b. The AV
CC
pin on the device should be connected to the digital V
CC
supply voltage
via an LC network as shown in Figure 26-9.
c. Use the ADC noise canceler function to reduce induced noise from the CPU.
d. If any ADC port pins are used as digital outputs, it is essential that these do not
switch while a conversion is in progress.
Figure 26-9. ADC power connections.
26.7.3 Offset compensation schemes
The gain stage has a built-in offset cancellation circuitry that nulls the offset of differential mea-
surements as much as possible. The remaining offset in the analog path can be measured
directly by selecting the same channel for both differential inputs. This offset residue can be then
subtracted in softw are from the measurement results. Using this kind of software based offset
correction, offset on any channel can be reduced below one LSB.
26.7.4 ADC accuracy definitions
An n-bit single-ended ADC converts a voltage linearly between GND and V
REF
in 2
n
steps
(LSBs). The lowest code is read as 0, and the highest code is read as 2
n
-1.
Several parameters describe the deviation from the ideal behavior:
VCC
GND
100nF
Analog ground plane
(ADC0) PF0
(ADC7) PF7
(ADC1) PF1
(ADC2) PF2
(ADC3) PF3
(ADC4) PF4
(ADC5) PF5
(ADC6) PF6
AREF
GND
AVCC
52
53
54
55
56
57
58
59
60
6161
6262
6363
6464
1
51
NC
(AD0) PA0
10μH