Datasheet

162
4337K–USB–04/08
AT89C5130A/31A-M
Notes: 1. Operating I
CC
is measured with all output pins disconnected; XTAL1 driven with T
CLCH
, T
CHCL
= 5 ns (see Figure 27-4.), V
IL
=
V
SS
+ 0.5V,
V
IH
= V
CC
- 0.5V; XTAL2 N.C.; EA = RST = Port 0 = V
CC
. I
CC
would be slightly higher if a crystal oscillator used (see Figure
27-1.).
2. Idle I
CC
is measured with all output pins disconnected; XTAL1 driven with T
CLCH
, T
CHCL
= 5 ns, V
IL
= V
SS
+ 0.5V, V
IH
= V
CC
-
0.5V; XTAL2 N.C; Port 0 = V
CC
; EA = RST = V
SS
(see Figure 27-2).
3. Power-down I
CC
is measured with all output pins disconnected; EA = V
CC
, PORT 0 = V
CC
; XTAL2 NC.; RST = V
SS
(see Fig-
ure 27-3.). In addition, the WDT must be inactive and the POF flag must be set.
4. Under steady state (non-transient) conditions, I
OL
must be externally limited as follows:
Maximum I
OL
per port pin: 10 mA
Maximum I
OL
per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total I
OL
for all output pins: 71 mA
If I
OL
exceeds the test condition, V
OL
may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test conditions.
Figure 27-1. I
CC
Test Condition, Active Mode
Figure 27-2. I
CC
Test Condition, Idle Mode
EA
V
CC
V
CC
I
CC
(NC)
CLOCK
SIGNAL
All other pins are disconnected.
RST
XTAL2
XTAL1
V
SS
V
CC
P0
RST
EA
XTAL2
XTAL1
V
SS
V
CC
V
CC
I
CC
(NC)
P0
V
CC
All other pins are disconnected.
CLOCK
SIGNAL
V
CC