Datasheet
Table Of Contents
- Features
- Temperature Sensor Features
- Serial EEPROM Features
- Table of Contents
- 1. Description
- 2. Pin Descriptions and Pinouts
- 3. Block Diagram
- 4. Device Communication
- 5. Device Addressing
- 6. Temperature Sensor
- 6.1 Functional Description
- 6.2 Register Descriptions
- 6.2.1 Pointer Register (8-bit Write Only, Address = N/A)
- 6.2.2 Capability Register (16-bit Read-only, Address = 00h)
- 6.2.3 Configuration Register (16-bit Read/Write, Address = 01h)
- 6.2.4 Upper Limit Register (16-bit Read/Write, Address = 02h)
- 6.2.5 Lower Limit Register (16-bit Read/Write, Address = 03h)
- 6.2.6 Critical Alarm Register (16-bit Read/Write, Address = 04h)
- 6.2.7 Temperature Register (16-bit Read-only, Address = 05h)
- 6.2.8 Manufacturer ID Register (16-bit Read-only, Address = 06h)
- 6.2.9 Device ID Register (16-bit Read-only, Address = 07h)
- 6.3 Temperature Sensor Write Operations
- 6.4 Temperature Sensor Read Operations
- 7. Serial EEPROM
- 8. Electrical Specifications
- 9. Ordering Code Detail
- 10. Ordering Information
- 11. Part Markings
- 12. Package Drawings
- 13. Revision History

37
AT30TSE004A [DATASHEET]
Atmel-8868C-DTS-AT30TSE004A-Datasheet_122013
8. Electrical Specifications
8.1 Absolute Maximum Ratings*
8.2 DC Characteristics
Applicable over recommended operating range: T
AI
= -20°C to +125°C, V
CC
= 1.7V to 3.6V (unless otherwise noted).
Notes: 1. V
IL
min and V
IH
max are reference only and are not tested.
2. TS in Shutdown mode.
3. Serial EEPROM inactive, TS in Shutdown mode.
Temperature under Bias. . . . . . . -40°C to +125°C
Storage Temperature . . . . . . . . -65°C to +150°C
Supply voltage
with respect to ground . . . . . . . . . . -0.5V to +4.3V
A
0
Pin . . . . . . . . . . . . . . . . . . . . . -0.5V to +12.0V
All other input voltages
with respect to ground . . . . . . -0.5V to V
CC
+ 0.5V
EVENT Pin . . . . . . . . . . . . . .-0.5V to V
CC
+ 0.3V
All other output voltages
with respect to ground . . . . . . -0.5V to V
CC
+ 0.5V
*Notice: Stresses beyond those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
Functional operation of the device at these ratings or any
other conditions beyond those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability. Voltage extremes referenced in
the “Absolute Maximum Ratings” are intended to
accommodate short duration undershoot/overshoot
conditions and does not imply or guarantee functional
device operation at these levels for any extended period of
time.
Pull-up voltages applied to the
EVENT Pin that exceed the
“Absolute Maximum Ratings” may forward bias the ESD
protection circuitry. Doing so may result in improper device
function and may corrupt temperature measurements.
Symbol Parameter Test Condition Min Typ Max Units
V
CC1
Supply Voltage 1.7 3.6 V
V
CC2
Supply Voltage 2.2 3.6 V
I
CC1
Supply Current
(2)
V
CC
= 3.6V Read at 100kHz 0.4 1.0 mA
I
CC2
Supply Current
(2)
V
CC
= 3.6V Write at 100kHz 1.5 3.0 mA
I
CC3
Temp Sensor V
CC
= 3.6V EE Inactive 0.2 0.5 mA
I
SB
Standby Current
(3)
V
CC
= 1.7V V
IN
= V
CC
or V
SS
1.6 3.0 μA
V
CC
= 3.6V V
IN
= V
CC
or V
SS
1.6 4.0 μA
I
LI
Input Leakage Current V
IN
= V
CC
or V
SS
0.1 2.0 μA
I
LO
Output Leakage Current V
OUT
= V
CC
or V
SS
0.1 2.0 μA
V
IL
Input Low Level
(1)
-0.5 0.3 * V
CC
V
V
IH
Input High Level
(1)
0.7 * Vcc
Vcc + 0.5 V
V
OL1
Low-Level Output Voltage
Open-Drain
V
CC
> 2V I
OL
= 3mA 0.4 V
V
OL2
V
CC
≤ 2V I
OL
= 2mA 0.2 * V
CC
V
I
OL
Low-Level Output Current
V
OL
= 0.4V Freq ≤ 400kHz 3.0 mA
V
OL
= 0.6V Freq ≤ 400kHz 6.0 mA
V
OL
= 0.4V Freq > 400kHz 20.0 mA
V
HV
A
0
Pin High Voltage V
HV
- V
CC
≥ 4.8V 7 10 V
V
HYST1
Input Hysteresis (SDA, SCL) V
CC
< 2V 0.10 * V
CC
V
V
HYST2
Input Hysteresis (SDA, SCL) V
CC
≥ 2V 0.05 * V
CC
V