Datasheet

93C46B
DS21172D-page 2
Preliminary
1997 Microchip Technology Inc.
1.0 ELECTRICAL
CHARACTERISTICS
1.1 Maxim
um Ratings*
V
CC
...................................................................................7.0V
All inputs and outputs w.r.t. V
SS
...............-0.6V to V
CC
+1.0V
Storage temperature .....................................-65
°
C to +150
°
C
Ambient temp. with power applied.................-65
°
C to +125
°
C
Soldering temperature of leads (10 seconds) .............+300
°
C
ESD protection on all pins................................................4 kV
*Notice:
Stresses above those listed under “Maximum ratings” may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at those or any other conditions
above those indicated in the operational listings of this specification is
not implied. Exposure to maximum rating conditions for extended peri-
ods may affect device reliability.
TABLE 1-1 PIN FUNCTION TABLE
Name Function
CS Chip Select
CLK Serial Data Clock
DI Serial Data Input
DO Serial Data Output
V
SS
Ground
NC No Connect
V
CC
Power Supply
TABLE 1-2 DC AND AC ELECTRICAL CHARACTERISTICS
All parameters apply over the
specified operating ranges
unless otherwise noted
Commercial (C) V
CC
= +4.5V to +5.5V Tamb = 0
°
C to +70
°
C
Industrial (I) V
CC
= +4.5V to +5.5V Tamb = -40
°
C to +85
°
C
Automotive (E) V
CC
= +4.5V to +5.5V Tamb = -40
°
C to +125
°
C
Parameter Symbol Min. Max. Units Conditions
High level input voltage V
IH
2.0 V
CC
+1 V (Note 2)
Low level input voltage V
IL
-0.3 0.8 V
Low level output voltage V
OL
0.4 V I
OL
= 2.1 mA; V
CC
= 4.5V
High level output voltage V
OH
2.4 V I
OH
= -400
µ
A; V
CC
= 4.5V
Input leakage current I
LI
-10 10
µ
A V
IN
= V
SS
to V
CC
Output leakage current I
LO
-10 10
µ
A V
OUT
= V
SS
to V
CC
Pin capacitance
(all inputs/outputs)
C
IN
, C
OUT
7 pF
V
IN
/V
OUT
= 0 V (Notes 1 & 2)
Tamb = +25
°
C, F
CLK
= 1 MHz
I
CC
read 1 mA
Operating current I
CC
write 1.5 mA
Standby current I
CCS
1
µ
A CS = V
SS
Clock frequency F
CLK
2 MHz V
CC
= 4.5V
Clock high time T
CKH
250 ns
Clock low time T
CKL
250 ns
Chip select setup time T
CSS
50 ns Relative to CLK
Chip select hold time T
CSH
0 ns Relative to CLK
Chip select low time T
CSL
250 ns
Data input setup time T
DIS
100 ns Relative to CLK
Data input hold time T
DIH
100 ns Relative to CLK
Data output delay time T
PD
400 ns C
L
= 100 pF
Data output disable time T
CZ
100 ns C
L
= 100 pF (Note 2)
Status valid time T
SV
500 ns C
L
= 100 pF
Program cycle time
T
WC
2 ms ERASE/WRITE mode
T
EC
6 ms ERAL mode
T
WL
15 ms WRAL mode
Endurance 1M cycles 25
°
C, V
CC
= 5.0V, Block Mode (Note 3)
Note 1:
This parameter is tested at Tamb = 25
°
C and F
CLK
= 1 MHz.
2:
This parameter is periodically sampled and not 100% tested.
3:
This application is not tested but guaranteed by characterization. For endurance estimates in a specific appli-
cation, please consult the Total Endurance Model which may be obtained on Microchip’s BBS or website.