Manual

7.1 Technical data
761 SD Compact IC / Instructions for Use 8.761.1043
107
7 Appendix
7.1 Technical data
Unless otherwise specified, the published data com-
prises typical values for the 761 SD Compact IC at an
ambient temperature of 25 °C.
7.1.1 Conductivity measurement
Measurement range 1 0…1000 µS/cm (resolution: 0.56 nS/cm)
Measurement range 2 0…250 µS/cm (resolution: 0.14 nS/cm)
Measurement range 3 0…50 µS/cm (resolution: 0.028 nS/cm)
Maximum error ± 1 % of full scale value and
± 1 % of measurement value (k = 16.7/cm)
Linearity Deviations < ± 0.5 % of full scale value
Noise
Measurement range 1
Measurement range 2
Measurement range 3
typ. 10 nS/cm
typ. 2.5 nS/cm
typ. 0.5 nS/cm
Drift (electronic) typ. < 10 ppm/h of full scale value
Temperature dependence typ. < 40 ppm/°C of full scale value
Reserve range > 33 % (k = 16.7/cm)
Sampling rate 10 measurements/s (fixed)
7.1.2 Conductivity detector
Construction Thermostatted conductivity detector with
2 ring-shaped steel electrodes
Measurement principle Alternating current measurement with 1 kHz fre-
quency and ca. 1.7 V amplitude (peak to peak).
Cell volume 1.5 µL
Cell constant approx. 17 /cm (the exact value is printed on the
detector)
Maximum back pressure
for measuring cell
5.0 MPa (50 bar)
Thermostatting Connectable dynamic control to adjustable oper-
ating temperature
Operating temperature Adjustable in steps of 5°C from 25…45°C