User's Manual
Table Of Contents
- Bookcase
- TABLE OF CONTENTS
- LIST OF FIGURES
- LIST OF TABLES
- About This Manual
- Chapter 1 Introduction
- Chapter 2 Command Dictionary
- Command Summary
- Command Descriptions
- Abort Interrupted Process
- Add Ambiguous Paths
- Add Atpg Constraints
- Add Atpg Functions
- Add Capture Handling
- Add Cell Constraints
- Add Cell Library
- Add Clocks
- Add Cone Blocks
- Add Control Points
- Add Display Instances
- Add Display Loop
- Add Display Path
- Add Display Scanpath
- Add Faults
- Add Iddq Constraints
- Add Initial States
- Add LFSR Connections
- Add LFSR Taps
- Add LFSRs
- Add Lists
- Add Mos Direction
- Add Net Property
- Add Nofaults
- Add Nonscan Handling
- Add Notest Points
- Add Observe Points
- Add Output Masks
- Add Pin Constraints
- Add Pin Equivalences
- Add Pin Strobes
- Add Primary Inputs
- Add Primary Outputs
- Add Random Weights
- Add Read Controls
- Add Scan Chains
- Add Scan Groups
- Add Scan Instances
- Add Scan Models
- Add Slow Pad
- Add Tied Signals
- Add Write Controls
- Analyze Atpg Constraints
- Analyze Bus
- Analyze Control
- Analyze Control Signals
- Analyze Drc Violation
- Analyze Fault
- Analyze Observe
- Analyze Race
- Analyze Restrictions
- Close Schematic Viewer
- Compress Patterns
- Create Initialization Patterns
- Create Patterns
- Delete Atpg Constraints
- Delete Atpg Functions
- Delete Capture Handling
- Delete Cell Constraints
- Delete Clocks
- Delete Cone Blocks
- Delete Control Points
- Delete Display Instances
- Delete Faults
- Delete Iddq Constraints
- Delete Initial States
- Delete LFSR Connections
- Delete LFSR Taps
- Delete LFSRs
- Delete Lists
- Delete Mos Direction
- Delete Net Property
- Delete Nofaults
- Delete Nonscan Handling
- Delete Notest Points
- Delete Observe Points
- Delete Output Masks
- Delete Paths
- Delete Pin Constraints
- Delete Pin Equivalences
- Delete Pin Strobes
- Delete Primary Inputs
- Delete Primary Outputs
- Delete Random Weights
- Delete Read Controls
- Delete Scan Chains
- Delete Scan Groups
- Delete Scan Instances
- Delete Scan Models
- Delete Slow Pad
- Delete Tied Signals
- Delete Write Controls
- Diagnose Failures
- Dofile
- Exit
- Extract Subckts
- Flatten Model
- Flatten Subckt
- Help
- Insert Testability
- Load Faults
- Load Paths
- Macrotest
- Mark
- Open Schematic Viewer
- Read Modelfile
- Read Procfile
- Read Subckts Library
- Redo Display
- Report Aborted Faults
- Report Atpg Constraints
- Report Atpg Functions
- Report AU Faults
- Report Bus Data
- Report Capture Handling
- Report Cell Constraints
- Report Clocks
- Report Cone Blocks
- Report Control Data
- Report Control Points
- Report Core Memory
- Report Display Instances
- Report Drc Rules
- Report Environment
- Report Failures
- Report Faults
- Report Feedback Paths
- Report Flatten Rules
- Report Gates
- Report Hosts
- Report Id Stamp
- Report Iddq Constraints
- Report Initial States
- Report LFSR Connections
- Report LFSRs
- Report Lists
- Report Loops
- Report Mos Direction
- Report Net Properties
- Report Nofaults
- Report Nonscan Cells
- Report Nonscan Handling
- Report Notest Points
- Report Observe Data
- Report Observe Points
- Report Output Masks
- Report Paths
- Report Pin Constraints
- Report Pin Equivalences
- Report Pin Strobes
- Report Primary Inputs
- Report Primary Outputs
- Report Procedure
- Report Pulse Generators
- Report Random Weights
- Report Read Controls
- Report Scan Cells
- Report Scan Chains
- Report Scan Groups
- Report Scan Instances
- Report Scan Models
- Report Seq_transparent Procedures
- Report Slow Pads
- Report Statistics
- Report Test Stimulus
- Report Testability Data
- Report Tied Signals
- Report Timeplate
- Report Version Data
- Report Write Controls
- Reset Au Faults
- Reset State
- Resume Interrupted Process
- Run
- Save Flattened Model
- Save Patterns
- Save Schematic
- Select Iddq Patterns
- Select Object
- Set Abort Limit
- Set Atpg Compression
- Set Atpg Limits
- Set Atpg Window
- Set AU Analysis
- Set Bist Initialization
- Set Bus Handling
- Set Bus Simulation
- Set Capture Clock
- Set Capture Handling
- Set Capture Limit
- Set Checkpoint
- Set Clock Restriction
- Set Clock_off Simulation
- Set Clockpo Patterns
- Set Contention Check
- Set Control Threshold
- Set Decision Order
- Set Dofile Abort
- Set Drc Handling
- Set Driver Restriction
- Set Fails Report
- Set Fault Mode
- Set Fault Sampling
- Set Fault Type
- Set Flatten Handling
- Set Gate Level
- Set Gate Report
- Set Hypertrophic Limit
- Set Iddq Checks
- Set Iddq Strobe
- Set Instancename Visibility
- Set Instruction Atpg
- Set Internal Fault
- Set Internal Name
- Set Interrupt Handling
- Set IO Mask
- Set Learn Report
- Set List File
- Set Logfile Handling
- Set Loop Handling
- Set Multiple Load
- Set Net Dominance
- Set Net Resolution
- Set Nonscan Model
- Set Number Shifts
- Set Observation Point
- Set Observe Threshold
- Set Output Comparison
- Set Output Mask
- Set Pathdelay Holdpi
- Set Pattern Source
- Set Possible Credit
- Set Procedure Cycle_checking
- Set Pulse Generators
- Set Race Data
- Set Rail Strength
- Set Ram Initialization
- Set Ram Test
- Set Random Atpg
- Set Random Clocks
- Set Random Patterns
- Set Random Weights
- Set Redundancy Identification
- Set Schematic Display
- Set Screen Display
- Set Self Initialization
- Set Sensitization Checking
- Set Sequential Learning
- Set Shadow Check
- Set Simulation Mode
- Set Skewed Load
- Set Split Capture_cycle
- Set Stability Check
- Set Static Learning
- Set Stg Extraction
- Set System Mode
- Set Test Cycle
- Set Trace Report
- Set Transition Holdpi
- Set Unused Net
- Set Workspace Size
- Set Xclock Handling
- Set Z Handling
- Set Zhold Behavior
- Set Zoom Factor
- Setup Checkpoint
- Setup LFSRs
- Setup Pin Constraints
- Setup Pin Strobes
- Setup Tied Signals
- Step
- System
- Undo Display
- Unmark
- Unselect Object
- Update Implication Detections
- View
- View Area
- Write Core Memory
- Write Environment
- Write Failures
- Write Faults
- Write Initial States
- Write Library_verification Setup
- Write Loops
- Write Modelfile
- Write Netlist
- Write Paths
- Write Primary Inputs
- Write Primary Outputs
- Write Procfile
- Write Statistics
- Write Timeplate
- Zoom In
- Zoom Out
- Chapter 3 Shell Commands
- Chapter 4 Test Pattern File Formats
- Chapter 5 Distributed FlexTest
- Appendix A Timing Command Dictionary
- Appendix B FlexTest WDB Translation Support
- INDEX
- Send us feedback

Command Dictionary Add Cell Constraints
FastScan and FlexTest Reference Manual, V8.6_4
2-43
Add Cell Constraints
Tools Supported: FastScan and FlexTest
Scope: Setup mode
Usage
ADD CEll Constraints {pin_pathname | {chain_name cell_position}} C0 | C1 |
CX | Ox | Xx
Description
Constrains scan cells to be at a constant value.
The Add Cell Constraints command constrains scan cells slightly differently for
FastScan and FlexTest. For FastScan, the command constrains scan cells to be at a
constant value during the ATPG process. For FlexTest, the command constrains
scan cells so that the tool loads them with a constant value during scan loading,
however, scan cells may change value after scan loading.
For both tools, you identify a scan cell by either specifying an output pin
pathname that connects to a scan memory element or by specifying a scan chain
name along with the cell’s position in the scan chain. The tool places the
constraint value that you specify at either the output pin or the scan cell MASTER.
The rules checker audits the correctness of the data that defines the constrained
scan cells immediately after scan cell identification. The checker identifies all
invalid scan cell constraints and an error condition occurs.
In the case of scan cells with improper controllability or observability, rather than
rejecting these circuits you can constrain (or mask) their controllability or
observability.
Arguments
• pin_pathname
A string that specifies the name of an output pin of the scan cell or an output
pin directly connected through only buffers and inverters to the output of a
scan memory element. The scan memory element is set to the value that you
specify such that the pin is at the constrained value.