User's Manual
Table Of Contents
- Bookcase
- TABLE OF CONTENTS
- LIST OF FIGURES
- LIST OF TABLES
- About This Manual
- Chapter 1 Introduction
- Chapter 2 Command Dictionary
- Command Summary
- Command Descriptions
- Abort Interrupted Process
- Add Ambiguous Paths
- Add Atpg Constraints
- Add Atpg Functions
- Add Capture Handling
- Add Cell Constraints
- Add Cell Library
- Add Clocks
- Add Cone Blocks
- Add Control Points
- Add Display Instances
- Add Display Loop
- Add Display Path
- Add Display Scanpath
- Add Faults
- Add Iddq Constraints
- Add Initial States
- Add LFSR Connections
- Add LFSR Taps
- Add LFSRs
- Add Lists
- Add Mos Direction
- Add Net Property
- Add Nofaults
- Add Nonscan Handling
- Add Notest Points
- Add Observe Points
- Add Output Masks
- Add Pin Constraints
- Add Pin Equivalences
- Add Pin Strobes
- Add Primary Inputs
- Add Primary Outputs
- Add Random Weights
- Add Read Controls
- Add Scan Chains
- Add Scan Groups
- Add Scan Instances
- Add Scan Models
- Add Slow Pad
- Add Tied Signals
- Add Write Controls
- Analyze Atpg Constraints
- Analyze Bus
- Analyze Control
- Analyze Control Signals
- Analyze Drc Violation
- Analyze Fault
- Analyze Observe
- Analyze Race
- Analyze Restrictions
- Close Schematic Viewer
- Compress Patterns
- Create Initialization Patterns
- Create Patterns
- Delete Atpg Constraints
- Delete Atpg Functions
- Delete Capture Handling
- Delete Cell Constraints
- Delete Clocks
- Delete Cone Blocks
- Delete Control Points
- Delete Display Instances
- Delete Faults
- Delete Iddq Constraints
- Delete Initial States
- Delete LFSR Connections
- Delete LFSR Taps
- Delete LFSRs
- Delete Lists
- Delete Mos Direction
- Delete Net Property
- Delete Nofaults
- Delete Nonscan Handling
- Delete Notest Points
- Delete Observe Points
- Delete Output Masks
- Delete Paths
- Delete Pin Constraints
- Delete Pin Equivalences
- Delete Pin Strobes
- Delete Primary Inputs
- Delete Primary Outputs
- Delete Random Weights
- Delete Read Controls
- Delete Scan Chains
- Delete Scan Groups
- Delete Scan Instances
- Delete Scan Models
- Delete Slow Pad
- Delete Tied Signals
- Delete Write Controls
- Diagnose Failures
- Dofile
- Exit
- Extract Subckts
- Flatten Model
- Flatten Subckt
- Help
- Insert Testability
- Load Faults
- Load Paths
- Macrotest
- Mark
- Open Schematic Viewer
- Read Modelfile
- Read Procfile
- Read Subckts Library
- Redo Display
- Report Aborted Faults
- Report Atpg Constraints
- Report Atpg Functions
- Report AU Faults
- Report Bus Data
- Report Capture Handling
- Report Cell Constraints
- Report Clocks
- Report Cone Blocks
- Report Control Data
- Report Control Points
- Report Core Memory
- Report Display Instances
- Report Drc Rules
- Report Environment
- Report Failures
- Report Faults
- Report Feedback Paths
- Report Flatten Rules
- Report Gates
- Report Hosts
- Report Id Stamp
- Report Iddq Constraints
- Report Initial States
- Report LFSR Connections
- Report LFSRs
- Report Lists
- Report Loops
- Report Mos Direction
- Report Net Properties
- Report Nofaults
- Report Nonscan Cells
- Report Nonscan Handling
- Report Notest Points
- Report Observe Data
- Report Observe Points
- Report Output Masks
- Report Paths
- Report Pin Constraints
- Report Pin Equivalences
- Report Pin Strobes
- Report Primary Inputs
- Report Primary Outputs
- Report Procedure
- Report Pulse Generators
- Report Random Weights
- Report Read Controls
- Report Scan Cells
- Report Scan Chains
- Report Scan Groups
- Report Scan Instances
- Report Scan Models
- Report Seq_transparent Procedures
- Report Slow Pads
- Report Statistics
- Report Test Stimulus
- Report Testability Data
- Report Tied Signals
- Report Timeplate
- Report Version Data
- Report Write Controls
- Reset Au Faults
- Reset State
- Resume Interrupted Process
- Run
- Save Flattened Model
- Save Patterns
- Save Schematic
- Select Iddq Patterns
- Select Object
- Set Abort Limit
- Set Atpg Compression
- Set Atpg Limits
- Set Atpg Window
- Set AU Analysis
- Set Bist Initialization
- Set Bus Handling
- Set Bus Simulation
- Set Capture Clock
- Set Capture Handling
- Set Capture Limit
- Set Checkpoint
- Set Clock Restriction
- Set Clock_off Simulation
- Set Clockpo Patterns
- Set Contention Check
- Set Control Threshold
- Set Decision Order
- Set Dofile Abort
- Set Drc Handling
- Set Driver Restriction
- Set Fails Report
- Set Fault Mode
- Set Fault Sampling
- Set Fault Type
- Set Flatten Handling
- Set Gate Level
- Set Gate Report
- Set Hypertrophic Limit
- Set Iddq Checks
- Set Iddq Strobe
- Set Instancename Visibility
- Set Instruction Atpg
- Set Internal Fault
- Set Internal Name
- Set Interrupt Handling
- Set IO Mask
- Set Learn Report
- Set List File
- Set Logfile Handling
- Set Loop Handling
- Set Multiple Load
- Set Net Dominance
- Set Net Resolution
- Set Nonscan Model
- Set Number Shifts
- Set Observation Point
- Set Observe Threshold
- Set Output Comparison
- Set Output Mask
- Set Pathdelay Holdpi
- Set Pattern Source
- Set Possible Credit
- Set Procedure Cycle_checking
- Set Pulse Generators
- Set Race Data
- Set Rail Strength
- Set Ram Initialization
- Set Ram Test
- Set Random Atpg
- Set Random Clocks
- Set Random Patterns
- Set Random Weights
- Set Redundancy Identification
- Set Schematic Display
- Set Screen Display
- Set Self Initialization
- Set Sensitization Checking
- Set Sequential Learning
- Set Shadow Check
- Set Simulation Mode
- Set Skewed Load
- Set Split Capture_cycle
- Set Stability Check
- Set Static Learning
- Set Stg Extraction
- Set System Mode
- Set Test Cycle
- Set Trace Report
- Set Transition Holdpi
- Set Unused Net
- Set Workspace Size
- Set Xclock Handling
- Set Z Handling
- Set Zhold Behavior
- Set Zoom Factor
- Setup Checkpoint
- Setup LFSRs
- Setup Pin Constraints
- Setup Pin Strobes
- Setup Tied Signals
- Step
- System
- Undo Display
- Unmark
- Unselect Object
- Update Implication Detections
- View
- View Area
- Write Core Memory
- Write Environment
- Write Failures
- Write Faults
- Write Initial States
- Write Library_verification Setup
- Write Loops
- Write Modelfile
- Write Netlist
- Write Paths
- Write Primary Inputs
- Write Primary Outputs
- Write Procfile
- Write Statistics
- Write Timeplate
- Zoom In
- Zoom Out
- Chapter 3 Shell Commands
- Chapter 4 Test Pattern File Formats
- Chapter 5 Distributed FlexTest
- Appendix A Timing Command Dictionary
- Appendix B FlexTest WDB Translation Support
- INDEX
- Send us feedback
Command Dictionary Select Iddq Patterns
FastScan and FlexTest Reference Manual, V8.6_4
2-417
Select Iddq Patterns
Tools Supported: FastScan and FlexTest
Scope: Atpg mode
Prerequisites: You must have set the fault type to IDDQ by using the Set Fault
Type -Iddq command. Also, you must use either the internal or external pattern
source; you cannot use the random or BIST pattern source. You can set the
pattern source to internal or external by using the Set Pattern Source command
with either the -Internal or -External switch.
Usage
For FastScan
SELect IDdq Patterns [-Max_measures number] [-Threshold number] [-Eliminate
| -Noeliminate]
For FlexTest
SELect IDdq Patterns [-TEst_coverage [integer]] [-Max_measures number]
[-Threshold number] [-Percentage number] [-Window number] [-
Eliminate |
-Noeliminate] [-
EXhaustive | -Incremental]
Description
Selects the patterns that most effectively detect IDDQ faults.
The Select Iddq Patterns command selects the patterns (cycles) that most
effectively detect IDDQ faults, given an external or internal pattern set. If you set
the pattern source to external, the tool places the patterns in the internal pattern set
and does its modifications and selections on that internal set. The tool uses the
following three-step selection process to select the most effective patterns:
1. The tool fault simulates the patterns in the current pattern source, without
dropping faults, and stores the fault simulation results for all patterns,
ignoring any possibly-detected faults.
You can modify the results of this process by preceding the Select Iddq
Patterns command with the Set Iddq Strobe and Set Iddq Checks
commands. If the pattern set already contains patterns with IDDQ