Datasheet

TEST RESULTS:
See attachment on page 3 for details.
DISCUSSION:
I. Failure Rate Calculation
Based on the 1000-hour, 125°C life test results from four qualification lots, the calculated failure
rate for SA E35W process is 1.2 FITs when derated to 25°C with activation energy of 0.8eV at 60%
confidence level. This failure rate is acceptable.
II. Qualification Requirements/Acceptance Criteria
Minimum three wafer lots need to be tested according to the following conditions. Listed also
are the defined sample plans and acceptance criteria.
Standard Stress Tests Test Conditions Sample Plan / Criteria
Infant Mortality Evaluation 125°C, 12 hours <= 300ppm *
Life Test 125°C, 1000 hours 0/77 or 3% LTPD
HAST Test ** 130°C/85% R.H. 96 hours 0/45 or 5% LTPD
Temperature Cycle ** -55°C to 125°C, 1000 cycles 0/77 or 3% LTPD
EEPROM W/E Endurance Per process IOS 0/77 or 3% LTPD
EEPROM Data Retention 150°C, 1000hrs 0/77 or 3% LTPD
ESD (HBM) Per specifications 0/3
Latch-up Per specifications 0/6
Note: * 300ppm for Infant Mortality Evaluation (IME) is the target only.
** Convection reflow preconditioning is required for SMT package devices.
III. Qualification Test Results
All samples from four fab lots have passed reliability tests.
CONCLUSION:
Total of four qualification lots have passed Maxim reliability qualification requirements. SA fab
is qualified to fabricate E35W process.