Datasheet
High-frequency noise in the power supply (V
DD
) could
influence the proper operation of the ADC’s fast com-
parator. Bypass V
DD
to the star ground with a network
of two parallel capacitors, 0.1µF and 4.7µF, located as
close as possible to the MAX1060/MAX1064s’ power-
supply pin. Minimize capacitor lead length for best sup-
ply-noise rejection, and add an attenuation resistor (5Ω)
if the power supply is extremely noisy.
__________________________Definitions
Integral Nonlinearity
Integral nonlinearity (INL) is the deviation of the values
on an actual transfer function from a straight line. This
straight line can be either a best-straight-line fit or a line
drawn between the end points of the transfer function,
once offset and gain errors have been nullified. The
MAX1060/MAX1064s’ INL is measured using the end-
point method.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between
an actual step width and the ideal value of 1 LSB. A
DNL error specification of less than 1 LSB guarantees
no missing codes and a monotonic transfer function.
Aperture Jitter
Aperture jitter (t
AJ
) is the sample-to-sample variation in
the time between the samples.
Aperture Delay
Aperture delay (t
AD
) is the time between the rising
edge of the sampling clock and the instant when an
actual sample is taken.
MAX1060/MAX1064
400ksps, +5V, 8-/4-Channel, 10-Bit ADCs
with +2.5V Reference and Parallel Interface
______________________________________________________________________________________ 17
CLK
ACQUISITION
CONTROL BYTE
CONVERSION
LOW
BYTE
HIGH
BYTE
D7–D0 D9–D8
LOW
BYTE
HIGH
BYTE
D7–D0
D9–D8
ACQUISITION
SAMPLING INSTANT
123 456 78910111213141516
WR
RD
HBEN
D7–D0
STATE
CONTROL
BYTE
Figure 10. Timing Diagram for Fastest Conversion