Datasheet

DS4830
Optical Microcontroller
5Maxim Integrated
ADC DC ELECTRICAL CHARACTERISTICS
(V
DD
= 2.97V to 3.63V, T
A
= -40NC to +85NC, unless otherwise noted. Typical values are at V
DD
= 3.3V, T
A
= +25NC.)
SAMPLE/HOLD DC ELECTRICAL CHARACTERISTICS
(V
DD
= 2.97V to 3.63V, T
A
= -40NC to +85NC, unless otherwise noted. Typical values are at V
DD
= 3.3V, T
A
= +25NC.)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
ADC Resolution ADC
R
Default or slow ADC clock setting 13 Bits
ADC Internal Reference
Accuracy
ADCREFACC -0.85 +0.85 %
ADC Operating Current I
ADC
See the DC Electrical
Characteristics
ADC Full-Scale 1 V
FS-ADC1
1.2 V
ADC Full-Scale 2 V
FS-ADC2
0.6 V
ADC Full-Scale 3 V
FS-ADC3
2.4 V
ADC Full-Scale 4 V
FS-ADC4
4.8 V
ADC Integral Nonlinearity ADCINL
Computed using end points best fit:
13-bit, +25°C, VDD = 3.3V, VFS-ADC3
10 LSB
ADC Differential Nonlinearity ADCDNL V
FS
= 1.2V ±0.5 LSB
ADC Sample-Sample Deviation ADC full-scale set to V
FS-ADC3 5 LSB
ADC Offset V
OFFSET-ADC
13-bit, V
FS
= 1.2V -8 +1 +8 LSB
GP[15:0] Input Resistance R
IN-ADC
15 MI
ADC Sample Rate f
SAMPLE
(Note 7) 8 ksps
ADC Temperature Conversion
Time
t
TEMP
4.2 ms
Internal Temperature
Measurement Error
TINT
ERR
(Note 8) ±2 NC
Remote Temperature
Measurement Error
(DS4830 Error Only)
TREM
ERR
(Note 8) ±2 NC
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Sample/Hold Input Range V
SHP
ADC-SHN[1:0] = GND 0 1 V
Sample/Hold Capacitance C
SH
ADC-SHP[1:0] to ADC-SHN[1:0] 5 pF
Sample Input Leakage I
SHLKG
ADC-SHP[1:0] and ADC-SHN[1:0]
connected to GND
1.2 FA
Sample Time t
s
ADC-SHP[1:0] and ADC-SHN[1:0]
connected to 50I voltage source
300 ns
Sample Conversion Complete t
h
Time from valid sample to ADC data
available
320 Fs
Sample Offset V
SH-OFF
Measured at 10mV -10 -1.6 +7 mV
Sample Error ERR
SH
V
ADC-SHP_
to V
ADC-SHN_
= 300mV,
t
s
= 300ns, driven with 50I voltage
source
-4 +4 %
Sample Discharge Strength R
DIS
ADC-SHP[1:0] or ADC-SHN[1:0] to GND 900
I