Datasheet

DS2413: 1-Wire Dual Channel Addressable Switch
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
Presence Detect Sample
Time (Notes 1, 20)
t
MSP
Standard speed, V
PUP
> 4.5V
67.4
75
µs
Standard speed
69.6
75
Overdrive speed, V
PUP
≥ 4.5V
7.7
10
Overdrive speed
9.1
10
IO PIN, 1-Wire WRITE
Write-0 Low Time
(Notes 1, 17)
t
W0L
Standard speed, V
PUP
> 4.5V
60
120
µs
Standard speed (Note 14)
62
120
Overdrive speed, V
PUP
≥ 4.5V
(Note 14)
7
16
Overdrive speed (Note 14)
8
16
Write-1 Low Time
(Notes 1, 17)
t
W1L
Standard speed
5
15
µs
Overdrive speed
1
2
IO PIN, 1-Wire READ
Read Low Time
(Notes 1, 18)
t
RL
Standard speed
5
15 - δ
µs
Overdrive speed
1
2 - δ
Read Sample Time
(Notes 1, 18)
t
MSR
Standard speed
t
RL
+ δ
15
µs
Overdrive speed
t
RL
+ δ
2
PIO Pins
Leakage Current
I
LP
Pin at 28V (Note 19)
8.5
24
µA
Input Capacitance
C
P
(Note 5)
100
pF
Output low voltage
V
OLP
20mA load current
0.4
V
Input Low Voltage
V
ILP
(Note 1)
0.8
V
Input High Voltage
(Note 21)
V
IHP
(Note 1)
V
PUP
–
0.3V
28 V
Note 1:
System requirement.
Note 2:
Full R
PUP
range guaranteed by design and simulation. not production tested. Production testing performed at a fixed R
PUP
value.
Maximum allowable pullup resistance is a function of the number of 1-Wire devices in the system and 1-Wire recovery times. The
specified value here applies to systems with only one device and with the minimum 1-Wire recovery times. For more heavily
loaded systems, an active pullup such as that found in the DS2482-x00 or DS2480B may be required. The DS2482-x00 may not
always detect the DS2413 presence pulse. For proper operation it may be necessary to disregard (force to 1) the PPD bit in the
DS2482-x00 status register.
Note 3:
The I-V characteristic is linear for voltages greater than 10V.
Note 4:
Capacitance on the data pin could be 800pF when V
PUP
is first applied. If a 2.2kΩ resistor is used to pull up the data line, 2.5µs
after V
PUP
has been applied the parasite capacitance will not affect normal communications.
Note 5:
Guaranteed by design and simulation. Not production tested.
Note 6:
The voltage on IO needs to be less than or equal to V
ILMAX
whenever the master drives the line low.
Note 7:
V
TL
and V
TH
are functions of the internal supply voltage, which is a function of V
PUP
and the 1-Wire Recovery Times. The V
TH
and
V
TL
maximum specifications are valid at V
PUPmax
(5.25V). In any case, V
TL
< V
TH
< V
PUP
.
Note 8:
Voltage below which, during a falling edge on IO, a logic 0 is detected.
Note 9:
Voltage above which, during a rising edge on IO, a logic 1 is detected.
Note 10:
After V
TH
is crossed during a rising edge on IO, the voltage on IO has to drop by at least V
HY
to be detected as logic '0'.
Note 11:
The I-V characteristic is linear for voltages less than 1V.
Note 12:
Applies to a single DS2413 attached to a 1-Wire line.
Note 13:
The earliest recognition of a negative edge is possible at t
REH
after V
TH
has been previously reached.
Note 14:
Highlighted numbers are NOT in compliance with legacy 1-Wire product standards. See comparison table below.
Note 15:
t
PDH
is deemed to have ended when the voltage on IO drops below 80% of V
PUP
on the leading edge of the presence-detect low
pulse. t
PDL
is deemed to have begun when the voltage on IO drops below 20% of V
PUP
on the leading edge of the pulse.
Note 16:
Interval during the negative edge on IO at the beginning of a Presence Detect pulse between the time at which the voltage is
80% of V
PUP
and the time at which the voltage is 20% of V
PUP
.
Note 17:
ε in Figure 12 represents the time required for the pullup circuitry to pull the voltage on IO up from V
IL
to V
TH
. The actual maximum
duration for the master to pull the line low is t
W1Lmax
+ t
F
- ε and t
W0Lmax
+ t
F
- ε respectively.
Note 18:
δ in Figure 12 represents the time required for the pullup circuitry to pull the voltage on IO up from V
IL
to the input high threshold
of the bus master. The actual maximum duration for the master to pull the line low is t
RLmax
+ t
F
.
Note 19:
The I-V characteristic is linear for voltages greater than 7V.
Note 20:
t
MSP
is a system required sample point and not directly production tested. Production testing is performed on related parameters
t
PDH
and t
PDL
. Parameter t
FPD
is guaranteed by design and simulation, not production tested.
Note 21:
Production tested for V
IHP(min)
. V
IHP(max)
is guaranteed by design and simulation, not production tested.
3 of 18