Instruction manual

TM 11-6625-3017-14
CONTENTS (Continued)
Paragraph Page
Measuring f.m. deviation 2-5 2-4
Measuring a.m. depth 2-6 2-5
Measuring f.m. on a.m. 2-7 2-5
Measuring a.m. on f.m. 2-8 2-6
Noise measurements 2-9 2-6
Oscillator arrangements 2-10 2-8
Measurement in 1 to 2 MHz range 2-11 2-9
Asymmetric modulation and carrier shift 2-12 2-9
Use of l.f. output terminals 2-13 2-10
Use of I.f. output socket 2-14 2-10
Crystal selection 2-15 2-10
F.m. stereo measurements 2-16 2-11
Phase modulation and telemetry deviation 2-17 2-14
Stray fields 2-18 2-14
SECTION 3 TECHNICAL DESCRIPTION
System operation 3-1 3-1
Power unit 3-2 3-2
Mixer 3-3 3-3
Local oscillator 3-4 3-3
I. f. Amplifier 3-5 3-4
Limiter 3-6 3-4
Discriminator 3-7 3-4
Calibrator 3-8 3-4
Low-pass filters 3-9 3-5
1st l.f. amplifier 3-10 3-5
2nd l.f. amplifier 3-11 3-5
Peak reading meter 3-12 3-6
A.m. detector 3-13 3-6
Between-units circuitry on chassis 3-14 3-6
4 MAINTENANCE
Introduction 4-1 4-1
Performance checks 4-3 4-1
Cleaning and lubrication 4-4 4-8
5 REPAIR
Introduction 5-1 5-1
Fault location 5-2 5-1
Waveforms 5-3 5-2
Realignment 5-4 5-2
Replacement of sub-assemblies 5-5 5-8
Replacement of components 5-6 5-9
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