Datasheet

4 Electrical Characteristics
4.7 Reliability
Table 23: Reliability Qualifications
Test Item Test Conditions Test Standard
HTOL (High Temperature
Operating Life)
125 °C, 1000 hours JESD22-A108
ESD (Electro-Static
Discharge Sensitivity)
HBM (Human Body Mode)
1
± 2000 V JS-001
CDM (Charge Device Mode)
2
± 1000 V JS-002
Latch up
Current trigger ± 200 mA
JESD78
Voltage trigger 1.5 × VDD
max
Preconditioning
Bake 24 hours @125 °C
Moisture soak (level 3: 192 hours @30 °C, 60% RH)
IR reflow solder: 260 + 0 °C, 20 seconds, three times
J-STD-020, JESD47,
JESD22-A113
TCT (Temperature Cycling
Test)
–65 °C / 150 °C, 500 cycles JESD22-A104
uHAST (Highly
Accelerated Stress Test,
unbiased)
130 °C, 85% RH, 96 hours JESD22-A118
HTSL (High Temperature
Storage Life)
150 °C, 1000 hours JESD22-A103
LTSL (Low Temperature
Storage Life)
–40 °C, 1000 hours JESD22-A119
1
JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
2
JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.
4.8 WiFi Radio
Table 24: WiFi Frequency
Min Typ Max
Parameter (MHz) (MHz) (MHz)
Center frequency of operating channel 2412 — 2484
4.8.1 WiFi RF Transmitter (TX) Specifications
Table 25: TX Power with Spectral Mask and EVM Meeting 802.11 Standards
Min Typ Max
Rate (dBm) (dBm) (dBm)
802.11b, 1 Mbps — 21.0 —
802.11b, 11 Mbps — 21.0 —
802.11g, 6 Mbps — 20.5 —
802.11g, 54 Mbps — 19.0 —
802.11n, HT20, MCS0 — 19.5 —
Cont’d on next page
Espressif Systems 55
Submit Documentation Feedback
ESP32-S3 Series Datasheet v1.2