Product Info

Report No: CCISE191202301-V01
Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCISE1912023
No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road,
Bao’an District, Shenzhen, Guangdong, China
Telephone: [phone] Fax: [phone], E-mail: [e-mail] Page 29 of 171
12.2 Power Reference Measurement
The Power Reference Measurement and Power Drift Measurement are for monitoring the power drift of the
device under test in the batch process. The minimum distance of probe sensors to surface determines the
closest measurement point to phantom surface. This distance cannot be smaller than the distance of sensor
calibration points to probe tip as defined in the probe properties.
12.3 Area & Zoom Scan Procedures
First Area Scan is used to locate the approximate location(s) of the local peak SAR value(s). The measurement
grid within an Area Scan is defined by the grid extent, grid step size and grid offset. Next, in order to determine
the EM field distribution in a three-dimensional spatial extension, Zoom Scan is required. The Zoom Scan is
performed around the highest E-field value to determine the averaged SAR-distribution over 10g. Area scan and
zoom scan resolution setting follows KDB 865664 D01v01r04 quoted below.