Datasheet

LTC6803-2/LTC6803-4
7
680324fa
TYPICAL PERFORMANCE CHARACTERISTICS
Internal Die Temperature
Measurement Error Using an
8mV/°K Scale Factor
External Temperature
Measurement Total Unadjusted
Error vs Input
ADC INL ADC DNL
Cell Input Bias Current During
Standby and Hardware Shutdown
ADC Normal Mode Rejection
vs Frequency
Standby Supply Current
vs Supply Voltage
Supply Current vs Supply Voltage
During Continuous Conversions
0
–10
–30
–50
–20
–40
–60
–70
FREQUENCY (Hz)
REJECTION (dB)
680324 G13
10 10k 100k1k100
INPUT (V)
0
INL (BITS)
2.0
1.5
0.5
1.0
0
–1.0
–0.5
–1.5
–2.0
1 2 4
680324 G14
53
INPUT (V)
0
DNL (BITS)
1.0
0.8
0.2
0.4
0.6
0
–0.6
–0.4
–0.2
–0.8
–1.0
1 2 4
680324 G15
53
TEMPERATURE (°C)
–40
0
CELL INPUT BIAS CURRENT (nA)
5
15
20
25
50
35
0
40
60
680324 G16
10
40
45
30
–20 20
80
100
120
C12
C6
C1
CELL INPUT = 3.6V
SUPPLY VOLTAGE (V)
0
SUPPLY CURRENT (µA)
6
8
10
30
50
680324 G17
4
2
0
10 20 40
12
14
16
60
125°C
85°C
25°C
–40°C
SUPPLY VOLTAGE (V)
0
SUPPLY CURRENT (µA)
650
7000
30
50
680324 G18
600
10 20 40
750
800
850
60
125°C
85°C
25°C
–40°C
CDC = 2
CONTINUOUS CONVERSION
TEMPERATURE INPUT VOLTAGE (V)
–4.5
TOTAL UNADJUSTED ERROR (mV)
–1.5
1.5
4.5
–3.0
0
3.0
1.0 2.0 3.0 4.0
680324 G20
5.00.50 1.5 2.5 3.5 4.5
T
A
= 125°C
T
A
= 85°C
T
A
= 25°C
T
A
= –40°C
TEMPERATURE (°C)
0
–10
E = (AMBIENT TEMP-INTERNAL
DIE TEMP READING) (°C)
–5
0
5
10
15
25
50 75 100
680324 G19
125 150
10 SAMPLES