Datasheet

LTC2935
4
2935fa
TYPICAL PERFORMANCE CHARACTERISTICS
Supply Current vs Supply Voltage
Normalized Reset and Power-Fail
Thresholds vs Temperature
Comparator Undervoltage
Glitch Immunity
Reset Timeout Period
vs Temperature
Voltage Output Low vs Pull-Up
Current (RST, PFO)
Voltage Output High vs Pull-Down
Current (RST, PFO)
V
CC
(V)
0
0
I
CC
(nA)
200
400
600
800
1000
1
234
2935 G01
56
40°C
25°C
85°C
S0 = S1 = S2 = GND
TEMPERATURE (°C)
–50
0.985
NORMALIZED THRESHOLD (V/ V)
0.990
0.995
1.000
1.005
1.015
–25
02550
2935 G02
75 100
1.010
COMPARATOR OVERDRIVE (%)
0.1
2.0
GLITCH DURATION, t
UV
(ms)
2.5
1 10 100
1.5
1.0
0.5
0
3.0
2935 G03
V
CC
= 3.6V
COMPARATORS PULL DOWN
ABOVE CURVE
TEMPERATURE (°C)
–50
140
t
RST
(ms)
160
180
200
220
260
–25
02550
2935 G04
75 100
240
V
CC
= 3.6V
PULL-UP CURRENT (mA)
0
0
V
OL
(mV)
20
40
60
80
100
1
234
2935 G05
5
40°C
25°C
85°C
V
CC
= 3V
PULL-DOWN CURRENT (mA)
0
3.2
V
OH
(mV)
3.3
3.4
3.5
3.6
–0.2
–0.4 –0.6 –0.8
2935 G06
–1
40°C
25°C
85°C
LTC2935-2
V
CC
= 3.6V
T
A
= 25°C, unless otherwise noted.
ELECTRICAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
Reset and Power-Fail Outputs: RST, PFO
V
OL
Voltage Output Low V
CC
= 1V, 200μA Pull-Up Current
V
CC
= 3V, 3mA Pull-Up Current
S2, S1, S0 = Low
l
l
25
50
100
150
mV
mV
V
OH
Voltage Output High (LTC2935-2) –200μA Pull-Down Current
l
0.7 • V
CC
V
I
OH
Current Output High, Leakage (LTC2935-1) V
RST
, V
PFO
= 3.6V
l
±1 ±10 nA
t
RST
Reset Timeout Period
l
140 200 260 ms
The l denotes the specifi cations which apply over the full operating
temperature range, otherwise specifi cations are at T
A
= 25°C, V
CC
= 3.6V, unless otherwise noted. (Note 2)
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2. All currents into pins are positive, all voltages are referenced to
GND unless otherwise noted.
Note 3. Guaranteed by design. Characterized, but not production tested.