Datasheet

LTC2229
3
2229fa
The denotes the specifications which apply over the full operating temperature range,
otherwise specifications are at T
A
= 25°C. A
IN
= –1dBFS. (Note 4)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
SNR Signal-to-Noise Ratio 5MHz Input 70.6 dB
40MHz Input 68.9 70.6 dB
70MHz Input 70.6 dB
140MHz Input 70.3 dB
SFDR Spurious Free Dynamic Range 5MHz Input 90 dB
2nd or 3rd Harmonic
40MHz Input
74 90 dB
70MHz Input 90 dB
140MHz Input 85 dB
SFDR Spurious Free Dynamic Range 5MHz Input 95 dB
4th Harmonic or Higher
40MHz Input
80 95 dB
70MHz Input 95 dB
140MHz Input 90 dB
S/(N+D) Signal-to-Noise Plus Distortion Ratio 5MHz Input 70.6 dB
40MHz Input 68.5 70.5 dB
70MHz Input 70.5 dB
140MHz Input 70 dB
I
MD
Intermodulation Distortion f
IN1
= 28.2MHz, f
IN2
= 26.8MHz 90 dB
Full Power Bandwidth Figure 8 Test Circuit 575 MHz
DY A IC ACCURACY
U
W
PARAMETER CONDITIONS MIN TYP MAX UNITS
V
CM
Output Voltage I
OUT
= 0 1.475 1.500 1.525 V
V
CM
Output Tempco ±25 ppm/°C
V
CM
Line Regulation 2.7V < V
DD
< 3.4V 3 mV/V
V
CM
Output Resistance –1mA < I
OUT
< 1mA 4
I TER AL REFERE CE CHARACTERISTICS
UU U
(Note 4)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
V
IN
Analog Input Range (A
IN
+
– A
IN
) 2.7V < V
DD
< 3.4V (Note 7) ±0.5 to ±1V
V
IN,CM
Analog Input Common Mode (A
IN
+
+ A
IN
)/2 Differential Input (Note 7) 1 1.5 1.9 V
Single Ended Input (Note 7)
0.5 1.5 2 V
I
IN
Analog Input Leakage Current 0V < A
IN
+
, A
IN
< V
DD
–1 1 µA
I
SENSE
SENSE Input Leakage 0V < SENSE < 1V –3 3 µA
I
MODE
MODE Pin Leakage –3 3 µA
t
AP
Sample-and-Hold Acquisition Delay Time 0 ns
t
JITTER
Sample-and-Hold Acquisition Delay Time Jitter 0.2 ps
RMS
CMRR Analog Input Common Mode Rejection Ratio 80 dB
A ALOG I PUT
UU
The denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at T
A
= 25°C. (Note 4)