Datasheet

LT6656
6
6656fc
For more information www.linear.com/LT6656
ELECTRICAL CHARACTERISTICS
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The LT6656C is guaranteed to meet specified performance from
0°C to 70°C. The LT6656C is designed, characterized and expected to
meet specified performance from –40°C to 85°C but is not tested or
QA sampled at these temperatures. The LT6656I is guaranteed to meet
specified performance from –40°C to 85°C. By design, the LT6656 is
guaranteed functional over the operating temperature range of –55°C to
125°C.
Note 3: If the LT6656 is stored outside of the specified temperature range,
the output may shift due to hysteresis.
Note 4: The stated temperature is typical for soldering of the leads during
manual rework. For detailed IR reflow recommendations, refer to the
Applications section.
Note 5: Temperature coefficient is measured by dividing the maximum
change in output voltage by the specified temperature range.
Note 6: Load regulation is measured with a pulse from no load to the
specified load current. Output changes due to die temperature change
must be taken into account separately.
Note 7: Excludes load regulation errors.
Note 8: Peak-to-peak noise is measured with a 3-pole highpass filter at
0.1Hz and a 4-pole lowpass filter at 10Hz. The unit is enclosed in a still-air
environment to eliminate thermocouple effects on the leads. The test
time is 10 seconds. RMS noise is measured on a spectrum analyzer in a
shielded environment.
Note 9: Long term stability typically has a logarithmic characteristic and
therefore, changes after 1000 hours tend to be much smaller than before
that time. Total drift in the second thousand hours is normally less than
one third that of the first thousand hours with a continuing trend toward
reduced drift with time. Long-term stability will also be affected by
differential stresses between the IC and the board material created during
board assembly.
Note 10: Hysteresis in output voltage is created by mechanical stress
that differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. For instruments that are stored at well controlled
temperatures (within 20 or 30 degrees of operational temperature)
hysteresis is usually not a dominant error source. Typical hysteresis is the
worst-case of 25°C to cold to 25°C or 25°C to hot to 25°C, preconditioned
by one thermal cycle.
TYPICAL PERFORMANCE CHARACTERISTICS
Output Voltage Temperature Drift Typical V
OUT
Distribution Supply Current vs Input Voltage
100
10
1
0.1
INPUT VOLTAGE (V)
0
SUPPLY CURRENT (µA)
10 186 14
6656 G17
20
8 164 122
T
A
= 125°C
T
A
= 85°C
T
A
= 25°C
T
A
= –40°C
T
A
= –55°C
1.25V OPTION
TEMPERATURE (°C)
–60 –40
–1000
0
1000
2000
CHANGE IN OUTPUT VOLTAGE (ppm)
3000
5000
6000
7000
8000
9000
4000
10000
–20 0 20 40
6652 G01
60 12010080
ALL OPTIONS
25 TYPICAL UNITS
NORMALIZED AT 25°C
C
L
= 1µF
I
L
= 0
OUTPUT VOLTAGE ERROR (%)
–0.10
0.10
NUMBER OF UNITS
200
20
180
140
100
60
160
120
80
40
0
6656 G02
–0.02–0.06 0.060.020
ALL OPTIONS
C
L
= 1µF
I
L
= 0
T
A
= 25°C