Datasheet

LT6654
4
6654fa
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: If the parts are stored outside of the specifi ed temperature range,
the output may shift due to hysteresis.
Note 3: Temperature coeffi cient is measured by dividing the maximum
change in output voltage by the specifi ed temperature range.
Note 4: Load regulation is measured on a pulse basis from no load to the
specifi ed load current. Output changes due to die temperature change
must be taken into account separately.
Note 5: Excludes load regulation errors.
Note 6: Peak-to-peak noise is measured with a 1-pole highpass fi lter at
0.1Hz and 2-pole lowpass fi lter at 10Hz. The unit is enclosed in a still-air
environment to eliminate thermocouple effects on the leads. The test
time is 10 seconds. RMS noise is measured on a spectrum analyzer in
a shielded environment where the intrinsic noise of the instrument is
removed to determine the actual noise of the device.
Note 7: Long-term stability typically has a logarithmic characteristic
and therefore, changes after 1000 hours tend to be much smaller than
before that time. Total drift in the second thousand hours is normally less
than one third that of the fi rst thousand hours with a continuing trend
toward reduced drift with time. Long-term stability will also be affected by
differential stresses between the IC and the board material created during
board assembly.
Note 8: Hysteresis in output voltage is created by package stress that
differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. Hysteresis measures the maximum output change for the
averages of three hot or cold temperature cycles. For instruments that
are stored at well controlled temperatures (within 20 or 30 degrees of
operational temperature), it’s usually not a dominant error source.
Note 9: The stated temperature is typical for soldering of the leads during
manual rework. For detailed IR refl ow recommendations, refer to the
Applications Information section.
ELECTRICAL CHARACTERISTICS
The l denotes the specifi cations which apply over the full operating
temperature range, otherwise specifi cations are at T
A
= 25°C, C
L
= 1μF and V
IN
= V
OUT
+ 0.5V, unless otherwise noted.
For LT6654-1.25, V
IN
= 2.4V, unless otherwise noted.
PARAMETER CONDITIONS MIN TYP MAX UNITS
Load Regulation (Note 4) I
OUT(SINK)
= 10mA
LT6654-2.048, LT6654-2.5, LT6654-3,
LT6654-3.3, LT6654-4.096, LT6654-5
LT6654-1.25
l
l
9
15
20
30
25
30
ppm/mA
ppm/mA
ppm/mA
ppm/mA
Dropout Voltage (Note 5) V
IN
– V
OUT
, ∆V
OUT
= 0.1%
I
OUT
= 0mA
LT6654-2.048, LT6654-2.5, LT6654-3,
LT6654-3.3, LT6654-4.096, LT6654-5
I
OUT(SOURCE)
= 10mA
I
OUT(SINK)
= –10mA
l
l
l
55 100
120
450
50
mV
mV
mV
mV
Minimum Input Voltage LT6654-1.25, ∆V
OUT
= 0.1%, I
OUT
= 0mA
LT6654-1.25, ∆V
OUT
= 0.1%, I
OUT
= ±10mA
l
l
1.5 1.6
1.8
2.4
V
V
V
Supply Current No Load
l
350
600
µA
µA
Output Short-Circuit Current Short V
OUT
to GND
Short V
OUT
to V
IN
40
30
mA
mA
Output Voltage Noise (Note 6) 0.1Hz ≤ f ≤ 10Hz
LT6654-1.25
LT6654-2.048
LT6645-2.5
LT6645-3
LT6645-3.3
LT6645-4
LT6645-5
10Hz ≤ f ≤ 1kHz
0.8
1.0
1.5
1.6
1.7
2.0
2.2
2.0
ppm
P-P
ppm
P-P
ppm
P-P
ppm
P-P
ppm
P-P
ppm
P-P
ppm
P-P
ppm
RMS
Turn-On Time 0.1% Settling, C
LOAD
= 1µF 150 µs
Long-Term Drift of Output Voltage (Note 7) 60 ppm/√kHr
Hysteresis (Note 8) ∆T = 0°C to 70°C
∆T = –40°C to 85°C
∆T = –40°C to 125°C
∆T = –55°C to 125°C
30
40
90
100
ppm
ppm
ppm
ppm