Datasheet

LT1116
3
1116fb
SYMBOL PARAMETERS CONDITIONS MIN TYP MAX UNITS
V
IH
+ Positive Latch Threshold ● 2.0 V
V
IL
– Latch Threshold ● 0.8 V
I
IL
Latch Input Current V
LATCH
= 0V ● –20 –500 µA
t
PD
Propagation Delay ∆V
IN
= 100mV, OD = 5mV (Note 4) 12 16 ns
● 18 ns
t
PD
Propagation Delay ∆V
IN
= 100mV, OD = 20mV (Note 4) 10 14 ns
● 16 ns
∆t
PD
Differential Propagation Delay ∆V
IN
= 100mV, OD = 5mV (Note 4) 3 ns
t
SU
Latch Set-Up Time (Note 5) 2 ns
t
H
Latch Hold Time (Note 5) 2 ns
ELECTRICAL CHARACTERISTICS
The ● denotes the specifications which apply over full operating temperature
range, otherwise specifications are at T
A
= 25°C. V
+
= 5V, V
+
= –5V, V
OUT
= (Q) = I .4V, LATCH = 0V, unless noted.
Note 4: t
PD
and ∆t
PD
cannot be measured in automatic handling
equipment with low values of overdrive. The LT1116 is sample tested with
a 1V step and 500mV overdrive. Correlation tests have shown that t
PD
and
∆t
PD
can be guaranteed with this test if additional DC tests are performed
to verify internal bias conditions are correct. For low overdrive conditions
V
OS
is added to the measured overdrive.
Note 5: Input latch set-up time, t
SU
, is the interval in which the input signal
must be stable prior to asserting the latch signal. The hold time,
t
H
, is the interval after the latch is asserted in which the input signal must
be stable.
Gain CharacteristIcs
Propagation Delay
vs Load Capacitance
Propagation Delay vs Overdrive
DIFFERENTIAL INPUT VOLTAGE (mV)
–2.5 2.5
OUTPUT VOLTAGE (V)
3.0
4.0
3.5
2.5
1.5
0.5
5.0
4.5
2.0
1.0
0
–1.5 1.5
– 0.5 0.50
LT1116 • TPC01
V
S
= ±5V
I
OUT
= 0
T
J
= 125°C
T
J
= –55°C
T
J
= 25°C
OVERDRIVE VOLTAGE (mV)
0
DELAY (ns)
15
20
25
40
10
5
0
10
20
30
50
LT1116 • TPC02
T
J
= 25°C
STEP SIZE = 100mV
t
PDLH
t
PDHL
OUTPUT LOAD CAPACITANCE (pF)
0
DELAY (ns)
12
16
20
18
14
10
6
2
40
8
4
0
10
20
30
50
LT1116 • TPC03
STEP = 100mV, OVERDRIVE = 5mV
t
PDLH
t
PDHL
TYPICAL PERFOR A CE CHARACTERISTICS
UW
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliabilty and lifetime.
Note 2: Input offset voltage is defined as the average of two offset
voltages measured by forcing first the Q output to 1.4V then forcing
the Q output to 1.4V.
Note 3: Input bias current is defined as the average of the two input
currents.