Datasheet

LTC2635
11
2635fb
Note 1. Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device reliability
and lifetime.
Note 2. All voltages are with respect to GND.
Note 3. High temperatures degrade operating lifetimes. Operating lifetime
is derated at temperatures greater than 105°C. Operating at temperatures
above 90°C and with V
CC
> 4V requires V
CC
slew rates to be no greater than
73mV/ms.
Note 4. Linearity and monotonicity are defined from code k
L
to code 2
N
1,
where N is the resolution and k
L
is given by k
L
= 0.016 • (2
N
/ V
FS
),
rounded to the nearest whole code. For V
FS
= 2.5V and N = 12, k
L
= 26
and linearity is defined from code 26 to code 4,095. For V
FS
= 4.096V and
N = 12, k
L
= 16 and linearity is defined from code 16 to code 4,095.
Note 5. Inferred from measurement at code 16 (LTC2635-12), code 4
(LTC2635-10) or code 1 (LTC2635-8), and at full-scale.
Note 6. This IC includes current limiting that is intended to protect the
device during momentary overload conditions. Junction temperature can
exceed the rated maximum during current limiting. Continuous operation
above the specified maximum operating junction temperature may impair
device reliability.
Note 7. Digital inputs at 0V or V
CC
.
Note 8. Guaranteed by design and not production tested.
Note 9. Internal Reference mode. DAC is stepped 1/4 scale to 3/4 scale and
3/4 scale to 1/4 scale. Load is 2kΩ in parallel with 100pF to GND.
Note 10. Temperature coefficient is calculated by dividing the maximum
change in output voltage by the specified temperature range.
Note 11. Maximum V
IH
= V
CC(MAX)
+ 0.5V.
Note 12. C
B
= capacitance of one bus line in pF.
Note 13. All values refer to V
IH
= V
IH(MIN)
and V
IL
= V
IL(MAX)
levels.
Note 14. Minimum V
IL
exceeds the Absolute Maximum rating. This condition
won’t damage the IC, but could degrade performance.
electrical characteristics