User manual

35
Table 12: Measurement rate for Leddar Vu8 100°
Accumulation
Oversampling
Measurement Rate (Hz)
LeddarVu
20°
LeddarVu
48°
LeddarVu
100°
1024
8
0.15
0.3
0.61
512
8
0.3
0.6
1.22
256
8
0.6
1.2
2.4
128
8
1.22
2.4
4.8
64
8
2.4
4.8
9.7
32
8
4.8
9.7
19.5
1024
4
0.3
0.6
1.2
512
4
0.6
1.2
2.4
256
4
1.2
2.4
4.8
128
4
2.4
4.8
9.7
64
4
4.8
9.7
19.5
32
4
9.7
19.5
39.0
4.5. CPU Load
The measurement rate varies with the accumulations and oversampling settings.
The higher the rate, the higher the processing load is on the source and control
assembly microcontroller. The Point parameter, in the Acquisition Settings dialog
box, (Device menu, Configuration> Acquisition) also has an impact on the
processing load since it impacts the number of sample points to process for each
segment.
Given the high flexibility of parameter settings, it is possible to create a processing
load that exceeds the capacity of the microcontroller. When the microcontroller load
is exceeded, the theoretical measurement rate will not be obtained.