Datasheet
14 | Keysight | U1450A/U1460A Insulation Resistance Testers - Data Sheet
U1451A/U1452A/U1452AT capacitance specifications
Capacitance specifications with accuracy of ± (% of reading + number of least significant digit)
1, 2, 3
Range Resolution Accuracy Signal
100 nF 0.1 nF 3% + 2 Sine wave: 54.5 Hz, < 2 V
1 µF 0.001 µF 3% + 2
10 µF 0.01 µF 3% + 2
100 µF 0.1 µF 5% + 2
4
@ < 50 µF
1. Overload protection: 1000 VRMS for short circuits with < 0.3 A current
2. The accuracy for all ranges is specified based on a film capacitor or better, and after the Null function is used to subtract the residual values (by
opening the test leads)
3. The maximum display is 1200 counts
4. Add additional accuracy of 0.1% per μF for values greater than 50 μF ― for example, 100 μF, additional accuracy of 5% is to be added
U1453A/U1461A capacitance specifications
Capacitance specifications with accuracy of ± (% of reading + number of least significant digit)
1, 2
Range Resolution Accuracy Measuring rate (at full scale)
10 nF 0.01 nF 1% + 2 5 times/second
100 nF 0.1 nF 1% + 2
1 µF 0.001 µF 1% + 2 2.4 times/second
10 µF 0.01 µF 1% + 2
100 µF 0.1 µF 1% + 2
1 mF 0.001 mF 1% + 2 1.0 times/second
10 mF 0.01 mF 1% + 2 0.1 times/second
1. Overload protection: 1000 VRMS for short circuits with < 0.3 A current
2. The accuracy for all ranges is specified based on a film capacitor or better, and after the Null function is used to subtract the residual values (by
opening the test leads)
U1451A/U1452A/U1452AT frequency specifications
Frequency specifications with accuracy of ± (% of reading + number of least significant digit)
1, 2
Range Resolution Accuracy Minimum input frequency
19.99 Hz 0.01 Hz 0.2% + 1 2 Hz
199.99 Hz 0.1 Hz 0.2% + 1
< 400 Hz 1 Hz 0.2% + 1 @ ≤ 400 Hz
1. Overload protection: 1000 V; input signal is < 1,000,000 V × Hz (product of voltage and frequency)
2. The frequency measurement is susceptible to error when measuring low-voltage and low-frequency signals. Shielding inputs from external noise
pickup is critical for minimizing measurement errors.










