Datasheet

TEK.COM 5
2470 Graphical SourceMeter
®
SMU Instrument Data Sheet
Unmatched System Integration and
Programming Flexibility
When a 2470 is configured into a multi-channel I-V test
system, its embedded Test Script Processor (TSP
®
)
allows it to run test scripts, so users can create powerful
measurement applications with significantly-reduced
development times. TSP technology also offers channel
expansion without a mainframe. Keithley’s TSP-Link
®
channel expansion bus can connect multiple 2470s
and other TSP instruments, including Keithley’s other
graphical SourceMeter instruments (2450, 2460, 2461),
Keithley’s DMM7510, DMM6500, and DAQ6510 graphical
multimeters, Series 2600B System SourceMeter SMU
instruments, and Series 3700A Switch/Multimeter
systems, in a master-subordinate configuration that
operates as one integrated system. The TSP-Link
expansion bus supports up to 32 units per GPIB or
IP address, making it easy to scale a system to fit an
application’s particular requirements.
Parallel Test Capability
The TSP technology in the 2470 supports testing multiple
devices in parallel to meet the needs of device research,
advanced semiconductor lab applications, and even high
throughput production test. This parallel testing capability
allows each instrument in the system to run its own
complete test sequence, creating a fully multi-threaded
test environment. The number of tests that can be run in
parallel on a graphical SourceMeter can be as high as the
number of instruments in the system.
Typical Applications
Ideal for current/voltage characterization and
functional test of a wide range of today’s modern
electronics and devices, including:
• Devices
– Power semiconductors and materials: SiC,
GaN, power MOSFETs, power diodes
– IGBT
– Thyristors, SCRs
– Transient suppression devices
– Circuit protection devices: TVS, MOVs,
fuses, etc.
– Connectors, switches, relays
– Power management modules
– Batteries
• Tests
– I-V characterization
– Forward voltage
– Breakdown voltage
– Leakage current
– Isolation
– Hi-Pot
– Dielectric withstanding
The 2470 is the ideal addition to your development bench for designing
today’s high power devices and components.
Characterize transistors with multiple SMU instruments on wafer or
packaged transistors